Inventor · disambiguated record
Franklin Stampley Walden, Ii
Also filed as: WALDEN II FRANKLIN STAMPLEY
30 granted patents·8 pending applications·83 citations·filing 2013–2025
95Inventor score
Files withPROTOCHIPS INC38
Top patents by PatentIndex Score
38 records- 0194US9466459B2Method for optimizing fluid flow across a sample within an electron microscope sample holderPROTOCHIPS INC·Filed 2015·Granted Oct 11, 2016·11 cites·19 claims
- 0293US12130858B2Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2023·Granted Oct 29, 2024·1 cites·20 claims
- 0393US11902665B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Feb 13, 2024·4 cites·20 claims
- 0489US10986279B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2020·Granted Apr 20, 2021·2 cites·12 claims
- 0588US10373800B2Method for optimizing fluid flow across a sample within an electron microscope sample holderPROTOCHIPS INC·Filed 2018·Granted Aug 6, 2019·3 cites·14 claims
- 0687US2025338020A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 0785USD841183SWindow E-chip for an electron microscopePROTOCHIPS INC·Filed 2016·Granted Feb 19, 2019·25 cites·1 claims
- 0885US9437393B2Method for forming an electrical connection to an sample support in an electron microscope holderPROTOCHIPS INC·Filed 2013·Granted Sep 6, 2016·11 cites·14 claims
- 0984US12375815B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Jul 29, 2025·0 cites·20 claims
- 1084US12284445B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2024·Granted Apr 22, 2025·0 cites·20 claims
- 1184US9818578B2Device for monitoring environmental states of a microscope sample with an electron microscope sample holderPROTOCHIPS INC·Filed 2015·Granted Nov 14, 2017·3 cites·20 claims
- 1284US2025053594A1Systems and methods of metadata and image management for reviewing data from transmission electron microscope (tem) sessionsPROTOCHIPS INC·Filed 2024·Application pending·0 cites
- 1380US10014154B2Method for enabling modular part replacement within an electron microscope sample holderPROTOCHIPS INC·Filed 2016·Granted Jul 3, 2018·2 cites·20 claims
- 1480US2025260901A1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 1577US12010430B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Jun 11, 2024·0 cites·20 claims
- 1676US11755639B2Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2022·Granted Sep 12, 2023·0 cites·20 claims
- 1776US10128079B2MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2016·Granted Nov 13, 2018·1 cites·20 claims
- 1876USD806892STip of a sample holderPROTOCHIPS INC·Filed 2014·Granted Jan 2, 2018·20 cites·1 claims
- 1975US11869744B2Electron microscope sample holder fluid handling with independent pressure and flow controlPROTOCHIPS INC·Filed 2022·Granted Jan 9, 2024·0 cites·12 claims
- 2074US11455333B1Systems and methods of metadata and image management for reviewing data from transmission electron microscope (TEM) sessionsPROTOCHIPS INC·Filed 2022·Granted Sep 27, 2022·0 cites·20 claims
- 2172US11477388B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Oct 18, 2022·0 cites·20 claims
- 2272US11170968B2MEMS frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2020·Granted Nov 9, 2021·0 cites·14 claims
- 2369US11514586B1Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2022·Granted Nov 29, 2022·0 cites·25 claims
- 2469US11399138B2Automated application of drift correction to sample studied under electron microscopePROTOCHIPS INC·Filed 2021·Granted Jul 26, 2022·0 cites·10 claims
- 2568US11222765B2Electron microscope sample holder fluid handling with independent pressure and flow controlPROTOCHIPS INC·Filed 2020·Granted Jan 11, 2022·0 cites·19 claims
- 2668US10777380B2MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2019·Granted Sep 15, 2020·0 cites·20 claims
- 2765US10446363B2MEMs frame heating platform for electron imagable fluid reservoirs or larger conductive samplesPROTOCHIPS INC·Filed 2018·Granted Oct 15, 2019·0 cites·20 claims
- 2864US9997330B2Method for optimizing fluid flow across a sample within an electron microscope sample holderPROTOCHIPS INC·Filed 2016·Granted Jun 12, 2018·0 cites·18 claims
- 2964US2025027899A1Electrochemistry microscopy bipolar reference electrode assemblyPROTOCHIPS INC·Filed 2024·Application pending·0 cites
- 3063US2025029810A1Methods and systems for selectively managing image and metadata from transmission electron microscope (tem) sessions at multiple temporal or spatial resolutionsPROTOCHIPS INC·Filed 2024·Application pending·0 cites
- 3162US10586679B2Method for enabling modular part replacement within an electron microscope sample holderPROTOCHIPS INC·Filed 2018·Granted Mar 10, 2020·0 cites·19 claims
- 3262US10256563B2Method for forming an electrical connection to a sample support in an electron microscope holderPROTOCHIPS INC·Filed 2017·Granted Apr 9, 2019·0 cites·17 claims
- 3361US10460906B2Method for monitoring environmental states of a microscope sample with an electron microscope sample holderPROTOCHIPS INC·Filed 2017·Granted Oct 29, 2019·0 cites·10 claims
- 3461US2025323009A1Systems and methods for temperature control in electron microscopyPROTOCHIPS INC·Filed 2025·Application pending·0 cites
- 3559US10503127B2Method for safe control of gas delivery to an electron microscope sample holderPROTOCHIPS INC·Filed 2018·Granted Dec 10, 2019·0 cites·15 claims
- 3652US9915926B2Method for safe control of gas delivery to an electron microscope sample holderPROTOCHIPS INC·Filed 2015·Granted Mar 13, 2018·0 cites·15 claims
- 3746US2014268321A1Device for imaging electron microscope environmental sample supports in a microfluidic or electrochemical chamber with an optical microscopePROTOCHIPS INC·Filed 2014·Application pending·0 cites
- 3845US2018372672A1Electrochemistry device with improved electrode arrangementPROTOCHIPS INC·Filed 2018·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →