Inventor · disambiguated record
Fumiaki Endo
Also filed as: ENDO FUMIAKI
7 granted patents·5 pending applications·452 citations·filing 1991–2012
87Inventor score
Files withHITACHI HIGH TECH CORP4HITACHI LTD2ASAHI MEDICAL CO1FUNAKOSHI TOMOHIRO1HITACHI ULSI SYS CO LTD1
Top patents by PatentIndex Score
12 records- 0190US5153444AMethod and apparatus for detecting patternsHITACHI LTD·Filed 1991·Granted Oct 6, 1992·92 cites·26 claims
- 0288US5417981AThermoplastic polymer composition and medical devices made of the sameTERUMO CORP·Filed 1993·Granted May 23, 1995·280 cites·24 claims
- 0374US8209135B2Wafer inspection data handling and defect review toolFUNAKOSHI TOMOHIRO·Filed 2011·Granted Jun 26, 2012·4 cites·10 claims
- 0470US6650409B1Semiconductor device producing method, system for carrying out the same and semiconductor work processing apparatus included in the same systemHITACHI LTD·Filed 1996·Granted Nov 18, 2003·39 cites·49 claims
- 0566US8625906B2Image classification standard update method, program, and image classification deviceISOMAE YUYA·Filed 2009·Granted Jan 7, 2014·4 cites·18 claims
- 0660US6555058B2Apparatus for artificial kidney, quality evaluating device for dialyzing fluid and dialyzing means using the same, and fluid circuitASAHI MEDICAL CO·Filed 2000·Granted Apr 29, 2003·32 cites·13 claims
- 0750US2007105245A1Wafer inspection data handling and defect review toolHITACHI HIGH TECH CORP·Filed 2006·Application pending·0 cites
- 0845US7132341B2Semiconductor integrated circuit device and the process of the sameHITACHI ULSI SYS CO LTD·Filed 2001·Granted Nov 7, 2006·1 cites·27 claims
- 0943US2009278923A1Defect review method and apparatusHITACHI HIGH TECH CORP·Filed 2009·Application pending·0 cites
- 1042US2008240545A1Inspection Assistance System, Data Processing Equipment, and Data Processing MethodHITACHI HIGH TECH CORP·Filed 2008·Application pending·0 cites
- 1132US2013134308A1Sample observation apparatus and method of markingHITACHI HIGH TECH CORP·Filed 2012·Application pending·0 cites
- 1228US2014084159A1Scanning electron microscope and method for preparing specimenYAESHIMA KAORI·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →