Inventor · disambiguated record
Fumitoshi Ito
Also filed as: ITO FUMITOSHI
39 granted patents·10 pending applications·452 citations·filing 2001–2024
98Inventor score
Top patents by PatentIndex Score
49 records- 0198US9917093B2Inter-plane offset in backside contact via structures for a three-dimensional memory deviceSANDISK TECHNOLOGIES LLC·Filed 2016·Granted Mar 13, 2018·41 cites·17 claims
- 0297US10103161B2Offset backside contact via structures for a three-dimensional memory deviceSANDISK TECHNOLOGIES LLC·Filed 2016·Granted Oct 16, 2018·29 cites·24 claims
- 0395US7499338B2Partitioned soft programming in non-volatile memorySANDISK CORP·Filed 2006·Granted Mar 3, 2009·50 cites·14 claims
- 0495US7495954B2Method for partitioned erase and erase verification to compensate for capacitive coupling effects in non-volatile memorySANDISK CORP·Filed 2006·Granted Feb 24, 2009·39 cites·30 claims
- 0594US7535766B2Systems for partitioned soft programming in non-volatile memorySANDISK CORP·Filed 2006·Granted May 19, 2009·39 cites·15 claims
- 0694US7440326B2Programming non-volatile memory with improved boostingSANDISK CORP·Filed 2006·Granted Oct 21, 2008·38 cites·47 claims
- 0793US7768826B2Methods for partitioned erase and erase verification in non-volatile memory to compensate for capacitive coupling effectsSANDISK CORP·Filed 2009·Granted Aug 3, 2010·26 cites·16 claims
- 0893US7087955B2Semiconductor device and a method of manufacturing the sameRENESAS TECH CORP·Filed 2004·Granted Aug 8, 2006·27 cites·25 claims
- 0992US8885416B2Bit line current trip point modulation for reading nonvolatile storage elementsSANDISK TECHNOLOGIES INC·Filed 2013·Granted Nov 11, 2014·13 cites·29 claims
- 1092US7499317B2System for partitioned erase and erase verification in a non-volatile memory to compensate for capacitive couplingSANDISK CORP·Filed 2006·Granted Mar 3, 2009·30 cites·25 claims
- 1191US7730490B2System with user access-control information having signature and flow setting information for controlling order of performance of functionsCANON KK·Filed 2007·Granted Jun 1, 2010·17 cites·12 claims
- 1290US7639836B2Image copying device and image processing systemCANON KK·Filed 2006·Granted Dec 29, 2009·13 cites·11 claims
- 1385US8026544B2Fabricating and operating a memory array having a multi-level cell region and a single-level cell regionSANDISK TECHNOLOGIES INC·Filed 2009·Granted Sep 27, 2011·12 cites·15 claims
- 1484US10445477B2Information processing system, method of controlling the system, information processing apparatus, web server, and storage mediumCANON KK·Filed 2017·Granted Oct 15, 2019·3 cites·19 claims
- 1584US8947699B2Image processing apparatus and control method thereofITO FUMITOSHI·Filed 2010·Granted Feb 3, 2015·6 cites·14 claims
- 1681US8400658B2Network device and workflow processing systemITO FUMITOSHI·Filed 2009·Granted Mar 19, 2013·11 cites·9 claims
- 1781US7349250B2Semiconductor deviceRENESAS TECH CORP·Filed 2005·Granted Mar 25, 2008·7 cites·19 claims
- 1877US9842199B2Information processing system, method of controlling the system, information processing apparatus, web server, and storage mediumCANON KK·Filed 2015·Granted Dec 12, 2017·2 cites·12 claims
- 1977US8988947B2Back bias during program verify of non-volatile storageSANDISK TECHNOLOGIES INC·Filed 2014·Granted Mar 24, 2015·5 cites·20 claims
- 2076US9148529B2Information processing apparatus, web server, control method and storage mediumITO FUMITOSHI·Filed 2010·Granted Sep 29, 2015·3 cites·19 claims
- 2176US8699052B2Image forming apparatus, control method, and programITO FUMITOSHI·Filed 2011·Granted Apr 15, 2014·3 cites·6 claims
- 2275US8942047B2Bit line current trip point modulation for reading nonvolatile storage elementsSANDISK TECHNOLOGIES INC·Filed 2014·Granted Jan 27, 2015·4 cites·18 claims
- 2371US9648200B2Image processing system storing received image data in folder, image processing method, and storage mediumCANON KK·Filed 2014·Granted May 9, 2017·2 cites·9 claims
- 2471US8312274B2Image processing apparatus and method for controlling the sameMATSUMOTO ATSUSHI·Filed 2007·Granted Nov 13, 2012·3 cites·3 claims
- 2567US8503244B2Fabricating and operating a memory array having a multi-level cell region and a single-level cell regionSANDISK TECHNOLOGIES INC·Filed 2012·Granted Aug 6, 2013·2 cites·20 claims
- 2667US7705387B2Non-volatile memory with local boosting control implantSANDISK CORP·Filed 2006·Granted Apr 27, 2010·6 cites·15 claims
- 2766US8593665B2Image forming system and information processing apparatusITO FUMITOSHI·Filed 2007·Granted Nov 26, 2013·2 cites·8 claims
- 2865US10051154B2Information processing apparatus, control method in information processing apparatus, and image processing apparatusCANON KK·Filed 2016·Granted Aug 14, 2018·1 cites·16 claims
- 2965US8354322B2Fabricating and operating a memory array having a multi-level cell region and a single-level cell regionSANDISK TECHNOLOGIES INC·Filed 2011·Granted Jan 15, 2013·2 cites·17 claims
- 3065US6734114B2Method for manufacturing semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2002·Granted May 11, 2004·10 cites·14 claims
- 3160US7977186B2Providing local boosting control implant for non-volatile memorySANDISK CORP·Filed 2006·Granted Jul 12, 2011·4 cites·20 claims
- 3259US7719052B2Semiconductor deviceRENESAS TECH CORP·Filed 2008·Granted May 18, 2010·1 cites·15 claims
- 3359US2009125360A1Workflow support apparatus, method of controlling the same, workflow support system, and programCANON KK·Filed 2008·Application pending·0 cites
- 3458US8493586B2Work flow system for deciding whether to execute the work flow based on function restriction informationITO FUMITOSHI·Filed 2009·Granted Jul 23, 2013·1 cites·13 claims
- 3555US2025357425A1Semiconductor package including a semiconductor die matrix tileSANDISK TECHNOLOGIES INC·Filed 2024·Application pending·0 cites
- 3653US9141990B2Expense registration system for registering expenses related to document received by faxCANON KK·Filed 2013·Granted Sep 22, 2015·0 cites·12 claims
- 3749US9635214B2Image processing system for setting filename to received image data, image processing method therefor, and storage mediumCANON KK·Filed 2014·Granted Apr 25, 2017·0 cites·9 claims
- 3847US8576634B2Semiconductor device comprising a memory cell group having a gate width larger than a second memory cell groupITO FUMITOSHI·Filed 2010·Granted Nov 5, 2013·0 cites·8 claims
- 3945US2004241867A1Method of analyzing a wafer for metal impuritiesFiled 2004·Application pending·0 cites
- 4043US2012224214A1Information processing apparatus, information processing system, method for controlling information processing apparatus, and storage mediumITO FUMITOSHI·Filed 2012·Application pending·0 cites
- 4142US2012113453A1Information processing apparatus, information processing apparatus control method, and programITO FUMITOSHI·Filed 2011·Application pending·0 cites
- 4240US2010211951A1Image processing apparatus, method of controlling the same, and storage mediumCANON KK·Filed 2010·Application pending·0 cites
- 4340US2012331175A1Image processing apparatus that communicates with server via relay device, method of controlling image processing apparatus, and storage mediumITO FUMITOSHI·Filed 2012·Application pending·0 cites
- 4439US10701225B2User interface definition for information processing apparatus, control method, and storage mediumCANON KK·Filed 2016·Granted Jun 30, 2020·0 cites·5 claims
- 4539US2004150120A1Semiconductor integrated circuit device and a method of manufacturing the sameFiled 2004·Application pending·0 cites
- 4639US2003127663A1Semiconductor integrated circuit device and a method of manufacturing the sameFiled 2002·Application pending·0 cites
- 4738US7067889B2Method for manufacturing semiconductor integrated circuit deviceRENESAS TECH CORP·Filed 2003·Granted Jun 27, 2006·0 cites·27 claims
- 4837US2002001899A1Semiconductor integrated circuit device and a method of manufacturing the sameFiled 2001·Application pending·0 cites
- 4933US9117516B2Resistance change memoryTOSHIBA KK·Filed 2013·Granted Aug 25, 2015·0 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →