Inventor · disambiguated record
Fumiharu Nakajima
Also filed as: NAKAJIMA FUMIHARU
21 granted patents·12 pending applications·28 citations·filing 2005–2022
91Inventor score
Top patents by PatentIndex Score
33 records- 0178US9953126B2Method of wiring layout, semiconductor device, program for supporting design of wiring layout, and method for manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2014·Granted Apr 24, 2018·4 cites·27 claims
- 0278US8336005B2Pattern dimension calculation method and computer program productTAGUCHI TAKAFUMI·Filed 2011·Granted Dec 18, 2012·5 cites·20 claims
- 0373US7713833B2Method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2009·Granted May 11, 2010·4 cites·12 claims
- 0472US7544952B2Multivalent ion generating source and charged particle beam apparatus using such ion generating sourceJAPAN SCIENCE & TECH AGENCY·Filed 2005·Granted Jun 9, 2009·4 cites·9 claims
- 0571US10483202B2Semiconductor device having a wiring line with an end portion having rounded side surfaces and manufacturing method thereofTOSHIBA MEMORY CORP·Filed 2016·Granted Nov 19, 2019·2 cites·10 claims
- 0671US8143171B2Method for manufacturing semiconductor device and computer readable medium for storing pattern size setting programMASHITA HIROMITSU·Filed 2009·Granted Mar 27, 2012·3 cites·6 claims
- 0770US9977855B2Method of wiring layout, semiconductor device, program for supporting design of wiring layout, and method for manufacturing semiconductor deviceTOSHIBA MEMORY CORP·Filed 2014·Granted May 22, 2018·2 cites·21 claims
- 0868US9177854B2Method of manufacturing semiconductor device using sidewall films for pitch multiplication in forming interconnectsTOSHIBA KK·Filed 2013·Granted Nov 3, 2015·1 cites·17 claims
- 0966US9786556B2Semiconductor device and method of manufacturing the semiconductor deviceTOSHIBA MEMORY CORP·Filed 2017·Granted Oct 10, 2017·1 cites·11 claims
- 1062US8347241B2Pattern generation method, computer-readable recording medium, and semiconductor device manufacturing methodTOSHIBA KK·Filed 2009·Granted Jan 1, 2013·1 cites·17 claims
- 1159US9576100B2Pattern data generation method, pattern verification method, and optical image calculation methodTOSHIBA KK·Filed 2014·Granted Feb 21, 2017·0 cites·13 claims
- 1258US8443310B2Pattern correcting method, mask forming method, and method of manufacturing semiconductor deviceKAJIWARA MASANARI·Filed 2011·Granted May 14, 2013·1 cites·20 claims
- 1357US9917049B2Semiconductor device having contacts in drawing area and the contacts connected to word lines extending from element formation areaTOSHIBA MEMORY CORP·Filed 2016·Granted Mar 13, 2018·0 cites·10 claims
- 1454US12154648B2Semiconductor device, semiconductor memory device, and manufacturing method of semiconductor deviceKIOXIA CORP·Filed 2022·Granted Nov 26, 2024·0 cites·14 claims
- 1553US8984454B2Pattern data generation method, pattern verification method, and optical image calculation methodTOSHIBA KK·Filed 2013·Granted Mar 17, 2015·0 cites·16 claims
- 1653US2016013097A1Semiconductor device and method of manufacturing the sameTOSHIBA KK·Filed 2015·Application pending·0 cites
- 1752US2012241834A1Semiconductor device and method of manufacturing the sameNAKAJIMA FUMIHARU·Filed 2011·Application pending·0 cites
- 1850US8617999B2Method of manufacturing semiconductor device and computer readable medium for storing pattern size setting programMASHITA HIROMITSU·Filed 2012·Granted Dec 31, 2013·0 cites·3 claims
- 1948US2010003819A1Design layout data creating method, computer program product, and method of manufacturing semiconductor deviceTAGUCHI TAKAFUMI·Filed 2009·Application pending·0 cites
- 2048US2010035168A1Pattern predicting method, recording media and method of fabricating semiconductor deviceNAKAJIMA FUMIHARU·Filed 2009·Application pending·0 cites
- 2144US9646982B2Semiconductor device and method of manufacturing the semiconductor deviceTOSHIBA KK·Filed 2015·Granted May 9, 2017·0 cites·6 claims
- 2243US2014183702A1Design method of wiring layout, semiconductor device, program for supporting design of wiring layout, and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2343US2010168895A1Mask verification method, method of manufacturing semiconductor device, and computer readable mediumMASHITA HIROMITSU·Filed 2009·Application pending·0 cites
- 2442US2013168827A1Design method of wiring layout, semiconductor device, program for supporting design of wiring layout, and method for manufacturing semiconductor deviceTOSHIBA KK·Filed 2013·Application pending·0 cites
- 2540US8609303B2Mask pattern generating method and computer program productKODAMA CHIKAAKI·Filed 2011·Granted Dec 17, 2013·0 cites·10 claims
- 2640US2012311511A1Mask inspection method, mask production method, semiconductor device production method, and mask inspection deviceTAGUCHI TAKAFUMI·Filed 2012·Application pending·0 cites
- 2737US2013111416A1Design data optimization method, storage medium including program for design data optimization method and photomask manufacturing methodNAKAGAWA SHINICHI·Filed 2012·Application pending·0 cites
- 2836US8266552B2Pattern generating method, method of manufacturing semiconductor device, and recording mediumTAGUCHI TAKAFUMI·Filed 2010·Granted Sep 11, 2012·0 cites·18 claims
- 2934US8618665B2Pattern layout in semiconductor deviceSHIKATA GO·Filed 2011·Granted Dec 31, 2013·0 cites·13 claims
- 3034US2011065030A1Mask pattern determining method, mask manufacturing method, and device manufacturing methodKOTANI TOSHIYA·Filed 2010·Application pending·0 cites
- 3134US2010314771A1Semiconductor device including an improved lithographic marginHOSOMURA YOSHIKAZU·Filed 2010·Application pending·0 cites
- 3234US2011047518A1Pattern determining methodAIBA ISSUI·Filed 2010·Application pending·0 cites
- 3333US10606165B2Mask pattern verification methodTOSHIBA MEMORY CORP·Filed 2018·Granted Mar 31, 2020·0 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →