Inventor · disambiguated record
Fumio Ogawa
Also filed as: OGAWA FUMIO
10 granted patents·1 pending application·202 citations·filing 1988–2024
89Inventor score
Top patents by PatentIndex Score
11 records- 0194US5017195ANon-dustable granular dye: dye particles coated with hydroxylpropyl cellulose or carbohydrateNIPPON KAYAKU KK·Filed 1988·Granted May 21, 1991·62 cites·6 claims
- 0286US7689151B2Multi-color image-forming apparatus, optical sensor, and method for the sameSTANLEY ELECTRIC CO LTD·Filed 2006·Granted Mar 30, 2010·12 cites·15 claims
- 0380US7929892B2High accuracy multi-color image forming apparatus and method for detecting positioning color image patternsSTANLEY ELECTRIC CO LTD·Filed 2010·Granted Apr 19, 2011·3 cites·18 claims
- 0472US5272728APreamble length adjustment method in communication network and independent synchronization type serial data communication deviceOGAWA FUMIO·Filed 1991·Granted Dec 21, 1993·49 cites·2 claims
- 0569US7582888B2Reflection type optical sensor and method for detecting surface roughnessSTANLEY ELECTRIC CO LTD·Filed 2007·Granted Sep 1, 2009·8 cites·11 claims
- 0667US2025214560A1Information processing apparatus and information processing methodTOYOTA MOTOR CO LTD·Filed 2024·Application pending·0 cites
- 0764US5337137AHeight sensor and air spring device incorporating the sameSTANLEY ELECTRIC CO LTD·Filed 1992·Granted Aug 9, 1994·30 cites·26 claims
- 0856US5056913AOptical gauging apparatusSTANLEY ELECTRIC CO LTD·Filed 1990·Granted Oct 15, 1991·27 cites·10 claims
- 0944US5600492ASurface-curved optical element adapted for emergence and incidence of parallel light raysSTANLEY ELECTRIC CO LTD·Filed 1995·Granted Feb 4, 1997·11 cites·4 claims
- 1039US9244416B2Apparatus for measuring deposited toner amount commonly for thickness and area determining regionsSTANLEY ELECTRIC CO LTD·Filed 2014·Granted Jan 26, 2016·0 cites·13 claims
- 1132US12478320B2Breathing sound measurement device and sleeping state measurement systemONEA CO LTD·Filed 2021·Granted Nov 25, 2025·0 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →