Inventor · disambiguated record
Fumihito Ohta
Also filed as: OHTA FUMIHITO
4 granted patents·4 pending applications·138 citations·filing 1996–2003
79Inventor score
Top patents by PatentIndex Score
8 records- 0180US5844850AApparatus for analyzing a failure in a semiconductor wafer and method thereofMITSUBISHI ELECTRIC CORP·Filed 1996·Granted Dec 1, 1998·70 cites·8 claims
- 0271US6009545ASystem for analyzing a failure in a semiconductor wafer by calculating correlation coefficient between collated data of defects per prescribed unit and failures per prescribed unitMITSUBISHI ELECTRIC CORP·Filed 1998·Granted Dec 28, 1999·45 cites·9 claims
- 0342US6108253AFailure analysis system, fatal failure extraction method and recording mediumMITSUBISHI ELECTRIC CORP·Filed 1999·Granted Aug 22, 2000·19 cites·18 claims
- 0441US6819788B2Failure analysis method that allows high-precision failure mode classificationRENESAS TECH CORP·Filed 2002·Granted Nov 16, 2004·4 cites·16 claims
- 0535US2003047810A1Electronic device having multilayer interconnection structureMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0632US2003057988A1Semiconductor device inspecting method using conducting AFMMITSUBISHI ELECTRIC CORP·Filed 2002·Application pending·0 cites
- 0729US2004243891A1Failure analysis method of semiconductor deviceRENESAS TECH CORP·Filed 2003·Application pending·0 cites
- 0827US2001006558A1Failure analysis method, compression threshold deriving method, and recording mediumMITSUBISHI ELECTRIC CORP·Filed 2000·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →