Inventor · disambiguated record
Futoshi Ojima
Also filed as: OJIMA FUTOSHI
3 granted patents·33 citations·filing 1993–2011
68Inventor score
Top patents by PatentIndex Score
3 records- 0153US8952338B2Crystalline quality evaluation apparatus for thin-film semiconductors, using μ-PCD techniqueSAKODA NAOKAZU·Filed 2011·Granted Feb 10, 2015·1 cites·6 claims
- 0249US5760597AMethod of and apparatus for measuring lifetime of carriers in semiconductor sampleKOBE STEEL LTD·Filed 1996·Granted Jun 2, 1998·17 cites·14 claims
- 0349US5438276AApparatus for measuring the life time of minority carriers of a semiconductor waferKOBE STEEL LTD·Filed 1993·Granted Aug 1, 1995·15 cites·13 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →