Inventor · disambiguated record
Futoshi Yurugi
Also filed as: YURUGI FUTOSHI
7 granted patents·8 pending applications·1 citations·filing 2016–2024
69Inventor score
Files withISHIDA SEISAKUSHO15
Top patents by PatentIndex Score
15 records- 0171US11353357B2Point of sale scale with a control unit that sets the price calculated when the product is removed from the scaleISHIDA SEISAKUSHO·Filed 2020·Granted Jun 7, 2022·1 cites·14 claims
- 0270US12504387B2X-ray inspection apparatus and sensitivity correction method for x-ray inspection apparatusISHIDA SEISAKUSHO·Filed 2024·Granted Dec 23, 2025·0 cites·6 claims
- 0366US12222301B2X-ray inspection apparatusISHIDA SEISAKUSHO·Filed 2023·Granted Feb 11, 2025·0 cites·9 claims
- 0465US12467885B2X-ray inspection deviceISHIDA SEISAKUSHO·Filed 2023·Granted Nov 11, 2025·0 cites·5 claims
- 0565US12280402B2Article sorting determination deviceISHIDA SEISAKUSHO·Filed 2024·Granted Apr 22, 2025·0 cites·6 claims
- 0660US2025123222A1X-ray inspection apparatusISHIDA SEISAKUSHO·Filed 2024·Application pending·0 cites
- 0758US12343189B2X-ray inspection apparatus and adjustment method thereofISHIDA SEISAKUSHO·Filed 2023·Granted Jul 1, 2025·0 cites·15 claims
- 0858US2024288592A1X-ray inspection apparatusISHIDA SEISAKUSHO·Filed 2024·Application pending·0 cites
- 0957US2024407742A1X-ray inspection apparatus and inspection method of x-ray sensor unitISHIDA SEISAKUSHO·Filed 2024·Application pending·0 cites
- 1055US2025137945A1X-ray inspection apparatusISHIDA SEISAKUSHO·Filed 2024·Application pending·0 cites
- 1155US2025137944A1X-ray inspection apparatusISHIDA SEISAKUSHO·Filed 2024·Application pending·0 cites
- 1255US2025172510A1X-ray inspection apparatusISHIDA SEISAKUSHO·Filed 2024·Application pending·0 cites
- 1341US2021004951A1Inspection apparatusISHIDA SEISAKUSHO·Filed 2020·Application pending·0 cites
- 1440US10859514B2X-ray inspection deviceISHIDA SEISAKUSHO·Filed 2016·Granted Dec 8, 2020·0 cites·4 claims
- 1536US2020394634A1Article discrimination system and checkout processing system including article discrimination systemISHIDA SEISAKUSHO·Filed 2020·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →