Inventor · disambiguated record
Gary Chen
Also filed as: CHEN GARY · CHEN GARY G · CHEN GARY GE
50 granted patents·13 pending applications·854 citations·filing 1998–2022
98Inventor score
Top patents by PatentIndex Score
63 records- 0196US6758263B2Heat dissipating component using high conducting insertsADVANCED ENERGY TECH·Filed 2001·Granted Jul 6, 2004·140 cites·23 claims
- 0295US10330617B2Wearable sensor badge for toxic industrial chemicalsDESIGN WEST TECH INC·Filed 2018·Granted Jun 25, 2019·12 cites·14 claims
- 0395US7460367B2Method and system for dissipating thermal energy from conduction-cooled circuit card assemblies which employ remote heat sinks and heat pipe technologyTRACEWELL SYSTEMS INC·Filed 2007·Granted Dec 2, 2008·76 cites·23 claims
- 0494US8431457B2Method for fabricating a shielded gate trench MOS with improved source pickup layoutCHANG HONG·Filed 2010·Granted Apr 30, 2013·20 cites·23 claims
- 0594US6391794B1Composition and method for cleaning residual debris from semiconductor surfacesMICRON TECHNOLOGY INC·Filed 2000·Granted May 21, 2002·66 cites·52 claims
- 0693US7437995B2Axially compact mechanical igniter for thermal batteries and the likeOMNITEK PARTNERS LLC·Filed 2006·Granted Oct 21, 2008·32 cites·27 claims
- 0792US6573175B1Dry low k film application for interlevel dielectric and method of cleaning etched featuresMICRON TECHNOLOGY INC·Filed 2001·Granted Jun 3, 2003·37 cites·78 claims
- 0890US7578895B1Perchlorate free flash bang compositions for pyrotechnic training roundsUS ARMY·Filed 2005·Granted Aug 25, 2009·15 cites·2 claims
- 0990US7108055B2Optimized heat sink using high thermal conducting base and low thermal conducting finsADVANCED ENERGY TECH·Filed 2003·Granted Sep 19, 2006·55 cites·3 claims
- 1088US6592777B2Manufacture and cleaning of a semiconductorMICRON TECHNOLOGY INC·Filed 2001·Granted Jul 15, 2003·24 cites·24 claims
- 1187US10774846B2Portable, low-power air filtration systemDESIGN WEST TECH INC·Filed 2017·Granted Sep 15, 2020·5 cites·6 claims
- 1287US6890865B2Low k film application for interlevel dielectric and method of cleaning etched featuresMICRON TECHNOLOGY INC·Filed 2003·Granted May 10, 2005·24 cites·62 claims
- 1387US6455906B2Gate stack structure with conductive silicide segment that has substantially etched nitride and/or oxynitride defects protruding from its sidewallsMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 24, 2002·22 cites·5 claims
- 1484US8994101B2Shielded gate trench MOS with improved source pickup layoutCHANG HONG·Filed 2013·Granted Mar 31, 2015·5 cites·7 claims
- 1584US6627913B2Insulation of an MRAM device through a self-aligned spacerMICRON TECHNOLOGY INC·Filed 2001·Granted Sep 30, 2003·40 cites·44 claims
- 1684US6358788B1Method of fabricating a wordline in a memory array of a semiconductor deviceMICRON TECHNOLOGY INC·Filed 1999·Granted Mar 19, 2002·40 cites·27 claims
- 1783US9669932B2Display mounting system for reduced HICPANASONIC AVIONICS CORP·Filed 2013·Granted Jun 6, 2017·12 cites·20 claims
- 1882US6664611B2Composition and method for cleaning residual debris from semiconductor surfacesMICRON TECHNOLOGY INC·Filed 2002·Granted Dec 16, 2003·21 cites·18 claims
- 1979US6162738ACleaning compositions for high dielectric structures and methods of using sameMICRON TECHNOLOGY INC·Filed 1998·Granted Dec 19, 2000·55 cites·45 claims
- 2078US9702678B1Armor piercing incendiary projectileUS ARMY·Filed 2016·Granted Jul 11, 2017·7 cites·3 claims
- 2177US7211200B2Manufacture and cleaning of a semiconductorMICRON TECHNOLOGY INC·Filed 2003·Granted May 1, 2007·10 cites·11 claims
- 2277US6605863B2Low k film application for interlevel dielectric and method of cleaning etched featuresMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 12, 2003·12 cites·47 claims
- 2374US6703303B2Method of manufacturing a portion of a memoryMICRON TECHNOLOGY INC·Filed 2003·Granted Mar 9, 2004·9 cites·27 claims
- 2473US8608879B1Environmentally friendly flare illuminant compositionSABATINI JESSE J·Filed 2011·Granted Dec 17, 2013·2 cites·2 claims
- 2573US6686275B2Method of selectively removing metal nitride or metal oxynitride extrusions from a semmiconductor structureMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 3, 2004·8 cites·21 claims
- 2672US7582517B2Method for making split dual gate field effect transistorSEMICONDUCTOR MFG INT SHANGHAI·Filed 2006·Granted Sep 1, 2009·5 cites·23 claims
- 2771US8093114B2Method for making split dual gate field effect transistorXIAO DEYUAN·Filed 2009·Granted Jan 10, 2012·4 cites·3 claims
- 2870US6933580B2Semiconductor structure with substantially etched oxynitride defects protruding therefromMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 23, 2005·7 cites·49 claims
- 2969US6794307B2Method for cleaning residual debris from semiconductor surfacesMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 21, 2004·9 cites·25 claims
- 3067US12432874B2Electronics box for in-flight entertainment systemPANASONIC AVIONICS CORP·Filed 2022·Granted Sep 30, 2025·0 cites·20 claims
- 3167US9252265B2Shielded gate trench MOS with improved source pickup layoutALPHA & OMEGA SEMICONDUCTOR·Filed 2015·Granted Feb 2, 2016·1 cites·16 claims
- 3266US6743720B2Method of manufacturing a portion of a memory by selectively etching to remove metal nitride or metal oxynitride extrusionsMICRON TECHNOLOGY INC·Filed 2003·Granted Jun 1, 2004·5 cites·56 claims
- 3365US6509278B1Method of forming a semiconductor contact that includes selectively removing a Ti-containing layer from the surfaceMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 21, 2003·20 cites·57 claims
- 3464US6815368B2Semiconductor substrate cleaningMICRON TECHNOLOGY INC·Filed 2003·Granted Nov 9, 2004·6 cites·16 claims
- 3563US6693354B2Semiconductor structure with substantially etched nitride defects protruding therefromMICRON TECHNOLOGY INC·Filed 2002·Granted Feb 17, 2004·4 cites·49 claims
- 3663US2020033279A1Wearable Sensor Badge For Toxic Industrial ChemicalsDESIGN WEST TECH INC·Filed 2019·Application pending·0 cites
- 3761US12381329B2Integrated processor and antenna system for a transportation vehiclePANASONIC AVIONICS CORP·Filed 2022·Granted Aug 5, 2025·0 cites·17 claims
- 3861US7459043B2Moisture-resistant black powder substitute compositionsALLIANT TECHSYSTEMS INC·Filed 2003·Granted Dec 2, 2008·4 cites·24 claims
- 3960US8513727B2Surrounding stacked gate multi-gate FET structure nonvolatile memory deviceXIAO DEYUAN·Filed 2010·Granted Aug 20, 2013·1 cites·12 claims
- 4060US6174391B1Magnesium-fueled pyrotechnic compositions and processes based on elvax-cyclohexane coating technologyUS ARMY·Filed 1999·Granted Jan 16, 2001·19 cites·21 claims
- 4159US7087534B2Semiconductor substrate cleaningMICRON TECHNOLOGY INC·Filed 2004·Granted Aug 8, 2006·4 cites·25 claims
- 4256US10630359B2Method and apparatus for beamforming training using framesPERASO TECH INC·Filed 2019·Granted Apr 21, 2020·0 cites·20 claims
- 4355US2006218798A1Knife holderCHEN GARY·Filed 2005·Application pending·0 cites
- 4454US2006244026A1Semiconductor substrate cleaningMICRON TECHNOLOGY INC·Filed 2006·Application pending·0 cites
- 4551US12422040B2Gear selection actuator for a shift-by-wire mechanismGHSP INC·Filed 2021·Granted Sep 23, 2025·0 cites·20 claims
- 4651US6224424B1Multi-line signal cableFiled 1999·Granted May 1, 2001·13 cites·10 claims
- 4750US2010010527A1Safety lancetCHEN GARY GE·Filed 2008·Application pending·0 cites
- 4849US8889510B2Surrounding stacked gate multi-gate FET structure nonvolatile memory deviceSEMICONDUCTOR MFG INT SHANGHAI·Filed 2013·Granted Nov 18, 2014·0 cites·18 claims
- 4948US9490695B1Method and apparatus for eliminating shimmeringMARVELL INT LTD·Filed 2013·Granted Nov 8, 2016·0 cites·18 claims
- 5046US7478594B1Laser primerUS ARMY·Filed 2006·Granted Jan 20, 2009·3 cites·7 claims
Showing the top 50 of 63 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →