Inventor · disambiguated record
Garam Choi
Also filed as: CHOI GARAM
11 granted patents·4 pending applications·20 citations·filing 2020–2025
84Inventor score
Files withSAMSUNG ELECTRONICS CO LTD15
Top patents by PatentIndex Score
15 records- 0194US11799463B2Duty adjustment circuit, and delay locked loop circuit and semiconductor memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Oct 24, 2023·4 cites·20 claims
- 0294US11437085B2Multi-phase clock generator, memory device including multi-phase clock generator, and method of generating multi-phase clock of memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Sep 6, 2022·8 cites·20 claims
- 0392US11329654B2Delay circuit of delay-locked loop circuit and delay-locked loop circuitSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted May 10, 2022·4 cites·20 claims
- 0488US11405029B2Duty adjustment circuit, and delay locked loop circuit and semiconductor memory device including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 2, 2022·2 cites·20 claims
- 0584US11568916B2Multi-phase clock generator, memory device including multi-phase clock generator, and method of generating multi-phase clock of memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jan 31, 2023·1 cites·20 claims
- 0679US2025342869A1Memory device and method for training per-pin operation parametersSAMSUNG ELECTRONICS CO LTD·Filed 2025·Application pending·0 cites
- 0775US11309002B2Delay locked loop circuit and semiconductor memory device having the sameSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Apr 19, 2022·1 cites·20 claims
- 0875US2025044222A1Image measurement device and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 0971US12455228B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Oct 28, 2025·0 cites·12 claims
- 1067US12400691B2Memory device and method for training per-pin operation parametersSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Aug 26, 2025·0 cites·20 claims
- 1159US12394470B2Semiconductor chip capable of calibrating bias voltage supplied to write clock buffer regardless of process variation and temperature variation, and devices including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Aug 19, 2025·0 cites·20 claims
- 1257US12422245B2Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2023·Granted Sep 23, 2025·0 cites·14 claims
- 1356US12481144B2EUV photomask inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Nov 25, 2025·0 cites·20 claims
- 1455US2025297849A1Semiconductor measurement deviceSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
- 1552US2025012556A1Semiconductor measurement apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →