Inventor · disambiguated record
Gary Elmore
Also filed as: ELMORE GARY
9 granted patents·195 citations·filing 1997–2005
90Inventor score
Top patents by PatentIndex Score
9 records- 0190US7184850B1System and method for allocating multi-function resources for a wetdeck process in semiconductor wafer fabricationNAT SEMICONDUCTOR CORP·Filed 2005·Granted Feb 27, 2007·29 cites·27 claims
- 0289US6957113B1Systems for allocating multi-function resources in a process system and methods of operating the sameNAT SEMICONDUCTOR CORP·Filed 2002·Granted Oct 18, 2005·43 cites·31 claims
- 0384US6959225B1Graphical user interface for allocating multi-function resources in semiconductor wafer fabrication and method of operationNAT SEMICONDUCTOR CORP·Filed 2003·Granted Oct 25, 2005·34 cites·32 claims
- 0482US7725207B1Systems for allocating multi-function resources in a process system and methods of operating the sameNAT SEMICONDUCTOR CORP·Filed 2005·Granted May 25, 2010·9 cites·20 claims
- 0579US6957114B1Graphical user interface for compliance monitoring in semiconductor wafer fabrication and method of operationNAT SEMICONDUCTOR CORP·Filed 2003·Granted Oct 18, 2005·13 cites·22 claims
- 0674US7373211B1Graphical user interface for compliance monitoring in semiconductor wafer fabrication and method of operationNAT SEMICONDUCTOR CORP·Filed 2005·Granted May 13, 2008·8 cites·24 claims
- 0774US6004399AUltra-low particle semiconductor cleaner for removal of particle contamination and residues from surface oxide formation on semiconductor wafersCYPRESS SEMICONDUCTOR CORP·Filed 1997·Granted Dec 21, 1999·46 cites·20 claims
- 0859US6961634B1System and method for allocating multi-function resources for a wetdeck process in semiconductor wafer fabricationNAT SEMICONDUCTOR CORP·Filed 2003·Granted Nov 1, 2005·5 cites·32 claims
- 0955US7043319B1System and method for visualizing the use of resources in a process systemNAT SEMICONDUCTOR CORP·Filed 2003·Granted May 9, 2006·8 cites·26 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →