Inventor · disambiguated record
Gary D. Grise
Also filed as: GRISE GARY · GRISE GARY D · GRISE GARY DOUGLAS
23 granted patents·3 pending applications·811 citations·filing 1981–2012
96Inventor score
Top patents by PatentIndex Score
26 records- 0199US4870470ANon-volatile memory cell having Si rich silicon nitride charge trapping layerIBM·Filed 1987·Granted Sep 26, 1989·465 cites·24 claims
- 0293US7620921B2IC chip at-functional-speed testing with process coverage evaluationIBM·Filed 2007·Granted Nov 17, 2009·33 cites·30 claims
- 0390US7240266B2Clock control circuit for test that facilitates an at speed structural testIBM·Filed 2005·Granted Jul 3, 2007·23 cites·37 claims
- 0487US6025992AIntegrated heat exchanger for memory moduleIBM·Filed 1999·Granted Feb 15, 2000·139 cites·8 claims
- 0586US8423847B2Microcontroller for logic built-in self test (LBIST)GRISE GARY D·Filed 2012·Granted Apr 16, 2013·5 cites·17 claims
- 0683US7840864B2Functional frequency testing of integrated circuitsIBM·Filed 2009·Granted Nov 23, 2010·8 cites·16 claims
- 0782US7996807B2Integrated test waveform generator (TWG) and customer waveform generator (CWG), design structure and methodIBM·Filed 2008·Granted Aug 9, 2011·11 cites·20 claims
- 0878US7856607B2System and method for generating at-speed structural tests to improve process and environmental parameter space coverageIBM·Filed 2007·Granted Dec 21, 2010·8 cites·25 claims
- 0977US7490280B2Microcontroller for logic built-in self test (LBIST)IBM·Filed 2006·Granted Feb 10, 2009·6 cites·10 claims
- 1075US5663806ANon-destructive target marking for image stitchingIBM·Filed 1995·Granted Sep 2, 1997·47 cites·10 claims
- 1174US7721170B2Apparatus and method for selectively implementing launch off scan capability in at speed testingIBM·Filed 2007·Granted May 18, 2010·7 cites·14 claims
- 1271US7840863B2Functional frequency testing of integrated circuitsIBM·Filed 2009·Granted Nov 23, 2010·4 cites·18 claims
- 1368US7779375B2Design structure for shutting off data capture across asynchronous clock domains during at-speed testingIBM·Filed 2007·Granted Aug 17, 2010·5 cites·11 claims
- 1468US4375085ADense electrically alterable read only memoryIBM·Filed 1981·Granted Feb 22, 1983·17 cites·14 claims
- 1566US8538718B2Clock edge grouping for at-speed testGRISE GARY D·Filed 2010·Granted Sep 17, 2013·2 cites·20 claims
- 1665US8205124B2Microcontroller for logic built-in self test (LBIST)GRISE GARY D·Filed 2008·Granted Jun 19, 2012·3 cites·26 claims
- 1765US7685542B2Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testingIBM·Filed 2007·Granted Mar 23, 2010·4 cites·15 claims
- 1864US7529294B2Testing of multiple asynchronous logic domainsIBM·Filed 2006·Granted May 5, 2009·4 cites·20 claims
- 1959US7290191B2Functional frequency testing of integrated circuitsIBM·Filed 2004·Granted Oct 30, 2007·6 cites·18 claims
- 2056US7698611B2Functional frequency testing of integrated circuitsIBM·Filed 2007·Granted Apr 13, 2010·2 cites·24 claims
- 2155US4446535ANon-inverting non-volatile dynamic RAM cellIBM·Filed 1981·Granted May 1, 1984·12 cites·12 claims
- 2241US7793176B2Method of increasing path coverage in transition test generationIBM·Filed 2007·Granted Sep 7, 2010·0 cites·8 claims
- 2341US7784000B2Identifying sequential functional paths for IC testing methods and systemIBM·Filed 2008·Granted Aug 24, 2010·0 cites·6 claims
- 2437US2008005634A1Scan chain circuitry that enables scan testing at functional clock speedGRISE GARY D·Filed 2006·Application pending·0 cites
- 2537US2008222472A1Method for automatic test pattern generation for one test constraint at a timeGRISE GARY D·Filed 2007·Application pending·0 cites
- 2636US2006248417A1Clock control circuit for test that facilitates an at speed structural testIBM·Filed 2005·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →