Inventor · disambiguated record
Gail D. Shelton
Also filed as: SHELTON GAIL · SHELTON GAIL D
26 granted patents·2 pending applications·407 citations·filing 1994–2003
97Inventor score
Top patents by PatentIndex Score
28 records- 0180US5424544AInter-pixel thermal isolation for hybrid thermal detectorsTEXAS INSTRUMENTS INC·Filed 1994·Granted Jun 13, 1995·52 cites·30 claims
- 0279US6383332B1Endpoint detection method and apparatus which utilize a chelating agent to detect a polishing endpointLSI LOGIC CORP·Filed 2000·Granted May 7, 2002·20 cites·7 claims
- 0376US6358819B1Dual gate oxide process for deep submicron ICSLSI LOGIC CORP·Filed 1998·Granted Mar 19, 2002·32 cites·33 claims
- 0475US6258205B1Endpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst materialLSI LOGIC CORP·Filed 2000·Granted Jul 10, 2001·17 cites·8 claims
- 0566US6509520B1High strength composite thermoelectric cooler and method for making sameRAYTHEON CO·Filed 1995·Granted Jan 21, 2003·33 cites·18 claims
- 0665US6080670AMethod of detecting a polishing endpoint layer of a semiconductor wafer which includes a non-reactive reporting specieLSI LOGIC CORP·Filed 1998·Granted Jun 27, 2000·31 cites·20 claims
- 0762US6090724AMethod for composing a thermally conductive thin film having a low dielectric propertyLSI LOGIC CORP·Filed 1998·Granted Jul 18, 2000·25 cites·7 claims
- 0861US5457318AThermal detector apparatus and method using reduced thermal capacityTEXAS INSTRUMENTS INC·Filed 1994·Granted Oct 10, 1995·20 cites·11 claims
- 0959US6071818AEndpoint detection method and apparatus which utilize an endpoint polishing layer of catalyst materialLSI LOGIC CORP·Filed 1998·Granted Jun 6, 2000·22 cites·9 claims
- 1059US5478242AThermal isolation of hybrid thermal detectors through an anisotropic etchTEXAS INSTRUMENTS INC·Filed 1994·Granted Dec 26, 1995·18 cites·12 claims
- 1157US6117779AEndpoint detection method and apparatus which utilize a chelating agent to detect a polishing endpointLSI LOGIC CORP·Filed 1998·Granted Sep 12, 2000·17 cites·13 claims
- 1256US5572029AThermal isolation for hybrid thermal detectorsFiled 1995·Granted Nov 5, 1996·19 cites·8 claims
- 1354US6136719AMethod and arrangement for fabricating a semiconductor deviceLSI LOGIC CORP·Filed 1999·Granted Oct 24, 2000·18 cites·20 claims
- 1451US6806162B1Method for composing a dielectric layer within an interconnect structure of a multilayer semiconductor deviceLSI LOGIC CORP·Filed 2003·Granted Oct 19, 2004·3 cites·5 claims
- 1551US5426303AThermal isolation structure for hybrid thermal detectorsTEXAS INSTRUMENTS INC·Filed 1994·Granted Jun 20, 1995·11 cites·20 claims
- 1647US6150175ACopper contamination control of in-line probe instrumentsLSI LOGIC CORP·Filed 1998·Granted Nov 21, 2000·9 cites·28 claims
- 1745US5578826AThermal isolation for hybrid thermal detectorsTEXAS INSTRUMENTS INC·Filed 1995·Granted Nov 26, 1996·11 cites·8 claims
- 1844US6206573B1High reliability bearing structureLSI LOGIC CORP·Filed 1998·Granted Mar 27, 2001·9 cites·19 claims
- 1941US6287987B1Method and apparatus for deposition of porous silica dielectricsLSI LOGIC CORP·Filed 1999·Granted Sep 11, 2001·7 cites·25 claims
- 2041US6225215B1Method for enhancing anti-reflective coatings used in photolithography of electronic devicesLSI LOGIC CORP·Filed 1999·Granted May 1, 2001·8 cites·26 claims
- 2140US2001051403A1Method and apparatus for deposition of porous silica dielectricsFiled 2001·Application pending·0 cites
- 2239US5604977AMethod of fabricating focal plane arrayTEXAS INSTRUMENTS INC·Filed 1995·Granted Feb 25, 1997·8 cites·8 claims
- 2338US5574282AThermal isolation for hybrid thermal detectorsTEXAS INSTRUMENTS INC·Filed 1994·Granted Nov 12, 1996·6 cites·18 claims
- 2437US2002058382A1Dual gate oxide process for deep submicron ICSFiled 2001·Application pending·0 cites
- 2535US6527867B1Method for enhancing anti-reflective coatings used in photolithography of electronic devicesLSI LOGIC CORP·Filed 2000·Granted Mar 4, 2003·0 cites·6 claims
- 2634US5653851AMethod and apparatus for etching titanate with organic acid reagentsTEXAS INSTRUMENTS INC·Filed 1994·Granted Aug 5, 1997·5 cites·11 claims
- 2734US5572059AThermal isolation of hybrid thermal detectors through an anisotropic etchTEXAS INSTRUMENTS INC·Filed 1995·Granted Nov 5, 1996·4 cites·8 claims
- 2833US6614097B1Method for composing a dielectric layer within an interconnect structure of a multilayer semiconductor deviceLSI LOGIC CORP·Filed 1998·Granted Sep 2, 2003·2 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →