Inventor · disambiguated record
Gernot Biese
Also filed as: BIESE GERNOT
3 granted patents·1 pending application·0 citations·filing 2007–2023
44Inventor score
Files withTEXAS INSTRUMENTS INC4
Top patents by PatentIndex Score
4 records- 0162US12381162B2Process for reducing pattern-induced wafer deformationTEXAS INSTRUMENTS INC·Filed 2023·Granted Aug 5, 2025·0 cites·29 claims
- 0256US11587889B2Reduced pattern-induced wafer deformationTEXAS INSTRUMENTS INC·Filed 2020·Granted Feb 21, 2023·0 cites·20 claims
- 0336US2008002171A1Method for in-line monitoring a lens controller of a photolithography systemTEXAS INSTRUMENTS INC·Filed 2007·Application pending·0 cites
- 0432US7601549B2Method of processing semiconductor wafersTEXAS INSTRUMENTS INC·Filed 2008·Granted Oct 13, 2009·0 cites·18 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →