Inventor · disambiguated record
Georg Eggers
Also filed as: EGGERS GEORG · EGGERS GEORG E · EGGERS GEORG ERHARD
11 granted patents·8 pending applications·72 citations·filing 2002–2007
88Inventor score
Top patents by PatentIndex Score
19 records- 0178US7099585B2Memory circuit with an optical inputINFINEON TECHNOLOGIES AG·Filed 2002·Granted Aug 29, 2006·30 cites·15 claims
- 0274US7877649B2Method and apparatus for testing a memory chip using a common node for multiple inputs and outputsQIMONDA AG·Filed 2007·Granted Jan 25, 2011·10 cites·5 claims
- 0368US7443713B2Integrated semiconductor memory and method for operating a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 28, 2008·3 cites·22 claims
- 0463US7161368B2Semiconductor component with internal heatingINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 9, 2007·7 cites·12 claims
- 0562US7482644B2Integrated semiconductor memory and method for electrically stressing an integrated semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jan 27, 2009·5 cites·14 claims
- 0652US6940775B2Integrated dynamic memory having a control circuit for controlling a refresh mode for memory cellsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Sep 6, 2005·7 cites·9 claims
- 0750US7247956B2Performance test boardINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jul 24, 2007·6 cites·18 claims
- 0847US7236412B2Integrated semiconductor memory with redundant memory cells replaceable for either true or complementary defective memory cellsINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 26, 2007·2 cites·40 claims
- 0945US2004246033A1Synchronizer signal generator device and process for generating a synchronizer signalINFINEON TECHNOLOGIES AG·Filed 2004·Application pending·0 cites
- 1042US2005133785A1Device and method for detecting the overheating of a semiconductor deviceINFINEON TECHNOLOGIES AG·Filed 2004·Application pending·0 cites
- 1141US7116737B2Apparatus for signaling that a predetermined time value has elapsedINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 3, 2006·0 cites·23 claims
- 1240US2007176255A1Integrated circuit arrangementKREUPL FRANZ·Filed 2006·Application pending·0 cites
- 1339US2006192085A1Semiconductor circuit and arrangement and method for monitoring fuses of a semiconductor circuitEGGERS GEORG E·Filed 2006·Application pending·0 cites
- 1437US7277338B2Method and device for testing semiconductor memory devicesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 2, 2007·2 cites·16 claims
- 1537US7060534B2Housing for semiconductor devices, semiconductor device pin, and method for the manufacturing of pinsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 13, 2006·0 cites·12 claims
- 1636US2004199730A1Device and method for controlling one or more memory modulesFiled 2004·Application pending·0 cites
- 1733US2005280036A1Semiconductor product having a first and at least one further semiconductor circuit and methodSCHROEDER STEPHAN·Filed 2005·Application pending·0 cites
- 1833US2007260955A1Test auxiliary device in a memory moduleKLIEWER JOERG·Filed 2007·Application pending·0 cites
- 1928US2003043675A1Memory systemFiled 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →