Inventor · disambiguated record
Gerd Frankowsky
Also filed as: FRANKOWSKY GERD · FRANKOWSKY GERD H
47 granted patents·3 pending applications·742 citations·filing 1999–2008
98Inventor score
Files withINFINEON TECHNOLOGIES AG42IBM2INFINEON TECHNOLOGIES CORP2INFINEON TECHNOLOGIES1QIMONDA AG1
Top patents by PatentIndex Score
50 records- 0195US6845554B2Method for connection of circuit unitsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jan 25, 2005·114 cites·7 claims
- 0294US6714418B2Method for producing an electronic component having a plurality of chips that are stacked one above the other and contact-connected to one anotherINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 30, 2004·89 cites·26 claims
- 0393US6603694B1Dynamic memory refresh circuitryINFINEON TECHNOLOGIES CORP·Filed 2002·Granted Aug 5, 2003·81 cites·6 claims
- 0490US6483764B2Dynamic DRAM refresh rate adjustment based on cell leakage monitoringIBM·Filed 2001·Granted Nov 19, 2002·87 cites·13 claims
- 0586US7074696B1Semiconductor circuit module and method for fabricating semiconductor circuit modulesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jul 11, 2006·43 cites·9 claims
- 0678US6426911B1Area efficient method for programming electrical fusesINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jul 30, 2002·27 cites·22 claims
- 0778US6357027B1On chip data comparator with variable data and compare result compressionINFINEON TECHNOLOGIES AG·Filed 1999·Granted Mar 12, 2002·42 cites·26 claims
- 0876US6909642B2Self trimming voltage generatorINFINEON TECHNOLOGIES CORP·Filed 2003·Granted Jun 21, 2005·22 cites·17 claims
- 0972US6853233B1Level-shifting circuitry having “high” output impedance during disable modeINFINEON TECHNOLOGIES AG·Filed 2000·Granted Feb 8, 2005·14 cites·24 claims
- 1072US6601205B1Method to descramble the data mapping in memory circuitsINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jul 29, 2003·17 cites·12 claims
- 1169US7173473B2Level-shifting circuitry having “high” output impedance during disable modeINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 6, 2007·5 cites·25 claims
- 1268US7208968B2Test system for testing integrated chips and an adapter element for a test systemINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 24, 2007·13 cites·21 claims
- 1368US6677770B2Programmable test socketINFINEON TECHNOLOGIES·Filed 2001·Granted Jan 13, 2004·11 cites·20 claims
- 1468US6570794B1Twisted bit-line compensation for DRAM having redundancyIBM·Filed 2001·Granted May 27, 2003·16 cites·7 claims
- 1566US6937531B2Memory device and method of storing fail addresses of a memory cellINFINEON TECHNOLOGIES AG·Filed 2003·Granted Aug 30, 2005·14 cites·29 claims
- 1666US6657453B2Semiconductor wafer testing system and methodINFINEON TECHNOLOGIES AG·Filed 2002·Granted Dec 2, 2003·10 cites·15 claims
- 1765US7034559B2Integrated test circuit in an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2004·Granted Apr 25, 2006·9 cites·20 claims
- 1865US6730989B1Semiconductor package and methodINFINEON TECHNOLOGIES AG·Filed 2000·Granted May 4, 2004·13 cites·22 claims
- 1963US7331005B2Semiconductor circuit device and a system for testing a semiconductor apparatusINFINEON TECHNOLOGIES AG·Filed 2005·Granted Feb 12, 2008·4 cites·23 claims
- 2063US6707746B2Fuse programmable I/O organizationINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 16, 2004·13 cites·63 claims
- 2160US6608783B2Twisted bit-line compensationINFINEON TECHNOLOGIES AG·Filed 2001·Granted Aug 19, 2003·11 cites·8 claims
- 2258US7061260B2Calibration device for the calibration of a tester channel of a tester device and a test systemINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 13, 2006·10 cites·17 claims
- 2357US6727586B2Semiconductor componentINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 27, 2004·7 cites·8 claims
- 2456US7434125B2Integrated circuit, test system and method for reading out an error datum from the integrated circuitINFINEON TECHNOLOGIES AG·Filed 2006·Granted Oct 7, 2008·3 cites·19 claims
- 2555US6734474B2Integrated semiconductor circuit having contact points and configuration having at least two such circuitsINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 11, 2004·6 cites·20 claims
- 2653US7437627B2Method and test device for determining a repair solution for a memory moduleINFINEON TECHNOLOGIES AG·Filed 2004·Granted Oct 14, 2008·7 cites·19 claims
- 2753US6961880B2Recording test information to identify memory cell errorsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Nov 1, 2005·7 cites·21 claims
- 2853US6958626B2Off chip driverINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 25, 2005·6 cites·36 claims
- 2953US6580613B2Solder-free PCB assemblyINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 17, 2003·4 cites·19 claims
- 3052US6696319B2Method of attaching semiconductor devices on a switching device and such an attached deviceINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 24, 2004·5 cites·18 claims
- 3150US6809972B2Circuit technique for column redundancy fuse latchesINFINEON TECHNOLOGIES AG·Filed 2003·Granted Oct 26, 2004·6 cites·27 claims
- 3246US7060529B2Multiple chip semiconductor arrangement having electrical components in separating regionsINFINEON TECHNOLOGIES AG·Filed 2004·Granted Jun 13, 2006·2 cites·20 claims
- 3344US6815803B1Multiple chip semiconductor arrangement having electrical components in separating regionsINFINEON TECHNOLOGIES AG·Filed 2000·Granted Nov 9, 2004·1 cites·21 claims
- 3444US6400650B1Pulse width detectionINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jun 4, 2002·2 cites·5 claims
- 3543US6697291B2Method for checking a conductive connection between contact pointsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Feb 24, 2004·3 cites·8 claims
- 3640US6717870B2Method for assessing the quality of a memory unitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 6, 2004·2 cites·31 claims
- 3739US7427870B2Test system for testing integrated circuits and a method for configuring a test systemINFINEON TECHNOLOGIES AG·Filed 2006·Granted Sep 23, 2008·0 cites·21 claims
- 3838US7211451B2Process for producing a component moduleINFINEON TECHNOLOGIES AG·Filed 2002·Granted May 1, 2007·0 cites·9 claims
- 3937US7409308B2Method and device for verifying output signals of an integrated circuitINFINEON TECHNOLOGIES AG·Filed 2006·Granted Aug 5, 2008·0 cites·34 claims
- 4037US6649999B2Semiconductor chip configuration with a layer sequence with functional elements contacted by contact padsINFINEON TECHNOLOGIES AG·Filed 2002·Granted Nov 18, 2003·0 cites·4 claims
- 4137US2009039910A1Test apparatus for semiconductor modulesQIMONDA AG·Filed 2008·Application pending·0 cites
- 4236US7228473B2Integrated module having a plurality of separate substratesINFINEON TECHNOLOGIES AG·Filed 2005·Granted Jun 5, 2007·0 cites·20 claims
- 4336US2005086564A1Multi-chip module and method for testingFiled 2004·Application pending·0 cites
- 4435US6651203B1On chip programmable data pattern generator for semiconductor memoriesINFINEON TECHNOLOGIES AG·Filed 1999·Granted Nov 18, 2003·7 cites·21 claims
- 4534US7483326B2Apparatus and method for monitoring a state, in particular of a fuseINFINEON TECHNOLOGIES AG·Filed 2003·Granted Jan 27, 2009·0 cites·13 claims
- 4633US6961917B2Method for activating fuse units in electronic circuit deviceINFINEON TECHNOLOGIES AG·Filed 2002·Granted Nov 1, 2005·0 cites·5 claims
- 4733US6367027B1Skew pointer generationINFINEON TECHNOLOGIES AG·Filed 1999·Granted Apr 2, 2002·5 cites·19 claims
- 4833US6324125B1Pulse width detectionINFINEON TECHNOLOGIES AG·Filed 1999·Granted Nov 27, 2001·3 cites·23 claims
- 4933US2004222812A1Integrated circuit having a test circuitFiled 2004·Application pending·0 cites
- 5032US6262615B1Dynamic logic circuitINFINEON TECHNOLOGIES AG·Filed 1999·Granted Jul 17, 2001·1 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →