Inventor · disambiguated record
Gengying Gao
Also filed as: GAO GENGYING
5 granted patents·22 citations·filing 2000–2004
74Inventor score
Files withNAT SEMICONDUCTOR CORP5
Top patents by PatentIndex Score
5 records- 0163US6842021B1System and method for detecting location of a defective electrical connection within an integrated circuitNAT SEMICONDUCTOR CORP·Filed 2003·Granted Jan 11, 2005·12 cites·14 claims
- 0244US6801046B1Method of testing the electrostatic discharge performance of an IC deviceNAT SEMICONDUCTOR CORP·Filed 2000·Granted Oct 5, 2004·4 cites·20 claims
- 0343US6424167B1Vibration resistant test module for use with semiconductor device test apparatusNAT SEMICONDUCTOR CORP·Filed 2000·Granted Jul 23, 2002·3 cites·9 claims
- 0442US7112981B1Method of debugging a 3D packaged ICNAT SEMICONDUCTOR CORP·Filed 2004·Granted Sep 26, 2006·3 cites·20 claims
- 0535US7410813B1Method of parallel lapping a semiconductor dieNAT SEMICONDUCTOR CORP·Filed 2004·Granted Aug 12, 2008·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →