Inventor · disambiguated record
George Logsdon
Also filed as: LOGSDON GEORGE · LOGSDON GEORGE W
14 granted patents·169 citations·filing 2002–2006
93Inventor score
Top patents by PatentIndex Score
14 records- 0190US7184850B1System and method for allocating multi-function resources for a wetdeck process in semiconductor wafer fabricationNAT SEMICONDUCTOR CORP·Filed 2005·Granted Feb 27, 2007·29 cites·27 claims
- 0289US6957113B1Systems for allocating multi-function resources in a process system and methods of operating the sameNAT SEMICONDUCTOR CORP·Filed 2002·Granted Oct 18, 2005·43 cites·31 claims
- 0384US6959225B1Graphical user interface for allocating multi-function resources in semiconductor wafer fabrication and method of operationNAT SEMICONDUCTOR CORP·Filed 2003·Granted Oct 25, 2005·34 cites·32 claims
- 0482US7725207B1Systems for allocating multi-function resources in a process system and methods of operating the sameNAT SEMICONDUCTOR CORP·Filed 2005·Granted May 25, 2010·9 cites·20 claims
- 0579US6957114B1Graphical user interface for compliance monitoring in semiconductor wafer fabrication and method of operationNAT SEMICONDUCTOR CORP·Filed 2003·Granted Oct 18, 2005·13 cites·22 claims
- 0674US7373211B1Graphical user interface for compliance monitoring in semiconductor wafer fabrication and method of operationNAT SEMICONDUCTOR CORP·Filed 2005·Granted May 13, 2008·8 cites·24 claims
- 0771US7826915B1System and method for providing automatic qualification intervention in a manufacturing processNAT SEMICONDUCTOR CORP·Filed 2006·Granted Nov 2, 2010·5 cites·20 claims
- 0861US8417367B1Manufacturing exception handling systemLOGSDON GEORGE·Filed 2004·Granted Apr 9, 2013·6 cites·40 claims
- 0959US6961634B1System and method for allocating multi-function resources for a wetdeck process in semiconductor wafer fabricationNAT SEMICONDUCTOR CORP·Filed 2003·Granted Nov 1, 2005·5 cites·32 claims
- 1058US7065424B1Systems and methods that monitor re-qualification indicia associated with durable items to ensure physical process qualityNAT SEMICONDUCTOR CORP·Filed 2004·Granted Jun 20, 2006·0 cites·22 claims
- 1155US7043319B1System and method for visualizing the use of resources in a process systemNAT SEMICONDUCTOR CORP·Filed 2003·Granted May 9, 2006·8 cites·26 claims
- 1253US7043317B1Semiconductor wafer fabrication furnace idle monitor and method of operationNAT SEMICONDUCTOR CORP·Filed 2003·Granted May 9, 2006·5 cites·22 claims
- 1349US7784423B1System and method for dispensing material onto a semiconductor waferNAT SEMICONDUCTOR CORP·Filed 2004·Granted Aug 31, 2010·2 cites·9 claims
- 1443US9235413B1Automated control of semiconductor wafer manufacturing based on electrical test resultsMACDONALD WILLIAM·Filed 2005·Granted Jan 12, 2016·2 cites·14 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →