Inventor · disambiguated record
George A. Sai-Halasz
Also filed as: ESAKI LEO · SAI-HALASZ GEORGE · SAI-HALASZ GEORGE A · SAI-HALASZ GEORGE ANTHONY
17 granted patents·584 citations·filing 1977–2009
95Inventor score
Top patents by PatentIndex Score
17 records- 0195US7714725B2Method and system for locating a dependentMEDVE ILDIKO·Filed 2009·Granted May 11, 2010·145 cites·5 claims
- 0291US4103312ASemiconductor memory devicesIBM·Filed 1977·Granted Jul 25, 1978·49 cites·50 claims
- 0390US5541427ASRAM cell with capacitorIBM·Filed 1993·Granted Jul 30, 1996·87 cites·1 claims
- 0487US7151445B2Method and system for locating a dependentMEDVE ILDIKO·Filed 2005·Granted Dec 19, 2006·29 cites·21 claims
- 0587US6774463B1Superconductor gate semiconductor channel field effect transistorIBM·Filed 1992·Granted Aug 10, 2004·70 cites·1 claims
- 0683US4250515AHeterojunction superlattice with potential well depth greater than half the bandgapUS ARMY·Filed 1978·Granted Feb 10, 1981·26 cites·6 claims
- 0774US7498943B2Method and system for locating a dependentMEDVE ILDIKO·Filed 2006·Granted Mar 3, 2009·7 cites·17 claims
- 0874US7355514B2Method and system for locating a dependentMEDVE ILDIKO·Filed 2006·Granted Apr 8, 2008·7 cites·16 claims
- 0974US4498046ARoom temperature cryogenic test interfaceIBM·Filed 1982·Granted Feb 5, 1985·26 cites·6 claims
- 1074US4348686AMicrowave-infrared detector with semiconductor superlattice regionUS ARMY·Filed 1980·Granted Sep 7, 1982·31 cites·10 claims
- 1173US4871919AElectron beam lithography alignment using electric field changes to achieve registrationIBM·Filed 1988·Granted Oct 3, 1989·18 cites·12 claims
- 1272US4208667AControlled absorption in heterojunction structuresUS ARMY·Filed 1978·Granted Jun 17, 1980·23 cites·3 claims
- 1368US4205331AInfrared optical devices of layered structureUS ARMY·Filed 1978·Granted May 27, 1980·28 cites·4 claims
- 1458US4889819AMethod for fabricating shallow junctions by preamorphizing with dopant of same conductivity as substrateIBM·Filed 1988·Granted Dec 26, 1989·24 cites·15 claims
- 1538US4326208ASemiconductor inversion layer transistorIBM·Filed 1980·Granted Apr 20, 1982·5 cites·7 claims
- 1636US4937640AShort channel MOSFETIBM·Filed 1986·Granted Jun 26, 1990·5 cites·18 claims
- 1730US6046669AFully testable CMOS comparator circuit with half-comparing stageIBM·Filed 1997·Granted Apr 4, 2000·4 cites·14 claims
Join the waitlist — get patent alerts
Get an alert when George A. Sai-Halasz files or is granted a new patent.
We store only your email — no account needed. See our privacy policy.
Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →