Inventor · disambiguated record
Gerard M. Salem
Also filed as: SALEM GERARD · SALEM GERARD M · SALEM GERARD MICHAEL
28 granted patents·2 pending applications·345 citations·filing 1994–2020
96Inventor score
Top patents by PatentIndex Score
30 records- 0192US6643807B1Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of large embedded arrays in manufacturing testIBM·Filed 2000·Granted Nov 4, 2003·89 cites·22 claims
- 0285US9857422B2Methods and systems for generating functional test patterns for manufacture testIBM·Filed 2016·Granted Jan 2, 2018·2 cites·13 claims
- 0384US10365132B2Methods and systems for performing test and calibration of integrated sensorsIBM·Filed 2018·Granted Jul 30, 2019·2 cites·7 claims
- 0478US10209306B2Methods and systems for generating functional test patterns for manufacture testIBM·Filed 2017·Granted Feb 19, 2019·1 cites·20 claims
- 0578US7308621B2Testing of ECC memoriesIBM·Filed 2002·Granted Dec 11, 2007·28 cites·19 claims
- 0678US7042776B2Method and circuit for dynamic read margin control of a memory arrayIBM·Filed 2004·Granted May 9, 2006·28 cites·14 claims
- 0776US5844917AMethod for testing adapter card ASIC using reconfigurable logicIBM·Filed 1997·Granted Dec 1, 1998·39 cites·12 claims
- 0874US8495287B2Clock-based debugging for embedded dynamic random access memory element in a processor coreCOLLURA ADAM B·Filed 2010·Granted Jul 23, 2013·4 cites·14 claims
- 0974US5664223ASystem for independently transferring data using two independently controlled DMA engines coupled between a FIFO buffer and two separate buses respectivelyIBM·Filed 1994·Granted Sep 2, 1997·71 cites·20 claims
- 1071US10247776B2Structurally assisted functional test and diagnostics for integrated circuitsIBM·Filed 2017·Granted Apr 2, 2019·1 cites·14 claims
- 1171US9733307B1Optimized chain diagnostic fail isolationIBM·Filed 2016·Granted Aug 15, 2017·1 cites·11 claims
- 1267US7194715B2Method and system for performing static timing analysis on digital electronic circuitsIBM·Filed 2004·Granted Mar 20, 2007·14 cites·12 claims
- 1366US8977895B2Multi-core diagnostics and repair using firmware and spare coresANANDAVALLY SREEKALA·Filed 2012·Granted Mar 10, 2015·3 cites·16 claims
- 1462US10585142B2Functional diagnostics based on dynamic selection of alternate clockingIBM·Filed 2017·Granted Mar 10, 2020·0 cites·13 claims
- 1562US10545188B2Functional diagnostics based on dynamic selection of alternate clockingIBM·Filed 2017·Granted Jan 28, 2020·0 cites·7 claims
- 1661US11378623B2Diagnostic enhancement for multiple instances of identical structuresIBM·Filed 2020·Granted Jul 5, 2022·0 cites·18 claims
- 1761US10930364B2Iterative functional test exerciser reload and executionIBM·Filed 2018·Granted Feb 23, 2021·1 cites·20 claims
- 1861US8984335B2Core diagnostics and repairIBM·Filed 2013·Granted Mar 17, 2015·1 cites·9 claims
- 1960US10203371B2Methods and systems for generating functional test patterns for manufacture testIBM·Filed 2016·Granted Feb 12, 2019·0 cites·7 claims
- 2057US10598526B2Methods and systems for performing test and calibration of integrated sensorsIBM·Filed 2016·Granted Mar 24, 2020·0 cites·12 claims
- 2152US7149941B2Optimized ECC/redundancy fault recoveryIBM·Filed 2002·Granted Dec 12, 2006·3 cites·20 claims
- 2252US5841790AApparatus for testing an adapter card ASIC with reconfigurable logicIBM·Filed 1997·Granted Nov 24, 1998·26 cites·12 claims
- 2346US10613142B2Non-destructive recirculation test support for integrated circuitsIBM·Filed 2017·Granted Apr 7, 2020·0 cites·18 claims
- 2445US5544088AMethod of I/O pin assignment in a hierarchial packaging systemIBM·Filed 1995·Granted Aug 6, 1996·28 cites·12 claims
- 2544US10571519B2Performing system functional test on a chip having partial-good portionsIBM·Filed 2016·Granted Feb 25, 2020·0 cites·11 claims
- 2642US6989696B2System and method for synchronizing divide-by countersIBM·Filed 2003·Granted Jan 24, 2006·3 cites·17 claims
- 2740US8169321B2Radio frequency-enabled electromigration fuseIYER SUBRAMANIAN S·Filed 2010·Granted May 1, 2012·0 cites·15 claims
- 2836US2008282123A1System and Method of Multi-Frequency Integrated Circuit TestingMEISSNER CHARLES L·Filed 2007·Application pending·0 cites
- 2929US2004066837A1Method and apparatus for providing accurate junction temperature in an integrated circuitFiled 2002·Application pending·0 cites
- 3027US8438431B2Support element office mode array repair code verificationMCCAIN EDWARD C·Filed 2009·Granted May 7, 2013·0 cites·2 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →