Inventor · disambiguated record
Gerard H. Vurens
Also filed as: VURENS GERARD · VURENS GERARD H
12 granted patents·2 pending applications·600 citations·filing 1994–2022
94Inventor score
Top patents by PatentIndex Score
14 records- 0196US6515745B2Optical measurement system using polarized lightHDI INSTRUMENTATION·Filed 2001·Granted Feb 4, 2003·109 cites·12 claims
- 0294US6134011AOptical measurement system using polarized lightHDI INSTRUMENTATION·Filed 1998·Granted Oct 17, 2000·136 cites·15 claims
- 0390US6307627B1Optical measurement system using polarized lightHDI INSTRUMENTATION·Filed 1999·Granted Oct 23, 2001·84 cites·41 claims
- 0490US5586040AProcess and apparatus for controlled laser texturing of magnetic recording diskIBM·Filed 1995·Granted Dec 17, 1996·68 cites·20 claims
- 0589US5726455ADisk film optical measurement systemSTORMEDIA INC·Filed 1996·Granted Mar 10, 1998·66 cites·20 claims
- 0685US6678043B1Methods and apparatus for surface analysisFiled 2000·Granted Jan 13, 2004·30 cites·15 claims
- 0780US7206066B2Reflectance surface analyzerKLA TENCOR TECH CORP·Filed 2004·Granted Apr 17, 2007·18 cites·19 claims
- 0871US5545478AProcess for bonding lubricants to a thin film storage mediaIBM·Filed 1994·Granted Aug 13, 1996·16 cites·2 claims
- 0970US5718942AThin film disc lubrication utilizing disparate lubricant solventSTORMEDIA INC·Filed 1996·Granted Feb 17, 1998·26 cites·4 claims
- 1070US5631081AProcess for bonding lubricants to a thin film storage mediaIBM·Filed 1994·Granted May 20, 1997·15 cites·6 claims
- 1165US7649624B1Systems and methods for detecting scratches on non-semiconductor wafer surfacesCRYSTAL TECH INC·Filed 2008·Granted Jan 19, 2010·3 cites·29 claims
- 1264US5898181AThin film optical measurement systemHDI INSTRUMENTATION·Filed 1997·Granted Apr 27, 1999·29 cites·24 claims
- 1353US2022387004A1Device for collection of biological samplesGRAPHENE DX INC·Filed 2022·Application pending·0 cites
- 1442US2018338702A1Shielded ring resonator structureEMPIRE TECHNOLOGY DEV LLC·Filed 2017·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →