Inventor · disambiguated record
Gi-Won Cha
Also filed as: CHA GI-WON
11 granted patents·278 citations·filing 1994–2016
91Inventor score
Top patents by PatentIndex Score
11 records- 0196US10192592B2Systems and methods involving data bus inversion memory circuitry, configuration and/or operation including data signals grouped into 10 bits and/or other featuresGSI TECHNOLOGY INC·Filed 2016·Granted Jan 29, 2019·24 cites·29 claims
- 0295US9384822B2Systems and methods involving data bus inversion memory circuitry, configuration and/or operation including data signals grouped into 10 bits and/or other featuresGSI TECHNOLOGY INC·Filed 2014·Granted Jul 5, 2016·25 cites·20 claims
- 0391US5495452ACircuit for controlling a self-refresh period in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1994·Granted Feb 27, 1996·100 cites·4 claims
- 0471US5812483AIntegrated circuit memory devices including split word lines and predecoders and related methodsSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 22, 1998·32 cites·21 claims
- 0570US5940343AMemory sub-word line driver operated by unboosted voltageSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Aug 17, 1999·30 cites·15 claims
- 0664US6172931B1Semiconductor memory device with a multi-bank structureSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted Jan 9, 2001·23 cites·17 claims
- 0762US6225854B1Voltage boosting circuit having cross-coupled precharge circuitsSAMSUNG ELECTRONICS CO LTD·Filed 1999·Granted May 1, 2001·22 cites·18 claims
- 0855US5723993APulse generating circuit for use in a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Mar 3, 1998·14 cites·5 claims
- 0936US6118722AIntegrated circuit memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1996·Granted Sep 12, 2000·5 cites·33 claims
- 1033US6018485ASemiconductor memory device with cascaded burn-in test capabilitySAMSUNG ELECTRONICS CO LTD·Filed 1998·Granted Jan 25, 2000·3 cites·8 claims
- 1129US5881004ABurn-in stress control circuit for a semiconductor memory deviceSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Mar 9, 1999·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →