Inventor · disambiguated record
Giuseppe Crippa
Also filed as: CRIPPA GIUSEPPE
9 granted patents·2 pending applications·68 citations·filing 2001–2017
85Inventor score
Top patents by PatentIndex Score
11 records- 0195US11131690B2Contact probe for testing headTECHNOPROBE SPA·Filed 2017·Granted Sep 28, 2021·15 cites·29 claims
- 0279US6515496B2Microstructure testing headTECHNOPROBE S R L·Filed 2001·Granted Feb 4, 2003·26 cites·35 claims
- 0364US6768327B2Testing head having vertical probes for semiconductor integrated electronic devicesTECHNOPROBE S R L·Filed 2002·Granted Jul 27, 2004·13 cites·48 claims
- 0459US7301354B2Contact probe for a testing head having vertical probes for semiconductor integrated devicesTECHNOPROBE SPA·Filed 2004·Granted Nov 27, 2007·9 cites·42 claims
- 0558US10228392B2Contact probe for a testing headTECHNOPROBE SPA·Filed 2016·Granted Mar 12, 2019·1 cites·36 claims
- 0653US10365299B2Manufacturing method of a semi-finished product comprising a plurality of contact probes for a testing head of electronic devices and related semi-finished productTECHNOPROBE SPA·Filed 2017·Granted Jul 30, 2019·0 cites·35 claims
- 0753US2017269125A1Contact probe for a testing headTECHNOPROBE SPA·Filed 2016·Application pending·0 cites
- 0846US6674298B2Testing head having cantilever probesTECHNOPROBE S R L·Filed 2001·Granted Jan 6, 2004·4 cites·49 claims
- 0942US10509056B2Probe card for a testing apparatus of electronic devices, particularly for extreme temperature applicationsTECHNOPROBE SPA·Filed 2016·Granted Dec 17, 2019·0 cites·21 claims
- 1038US7227368B2Testing head contact probe with an eccentric contact tipTECHNOPROBE SPA·Filed 2005·Granted Jun 5, 2007·0 cites·23 claims
- 1132US2003151419A1Contact probe for a testing headTECHNOPROBE S R L·Filed 2002·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →