Inventor · disambiguated record
Giora Dishon
Also filed as: DISHON GIORA · DISHON GIORA J
15 granted patents·1 pending application·754 citations·filing 1976–2014
95Inventor score
Files withNOVA MEASURING INSTR LTD8MICROELECTRONICS CENTER OF NOR2US ENERGY2DISHON GIORA1FINAROV MOSHE1
Top patents by PatentIndex Score
16 records- 0196US4921157AFluxless soldering processMICROELECTRONICS CENTER OF NOR·Filed 1989·Granted May 1, 1990·100 cites·43 claims
- 0295US5325265AHigh performance integrated circuit chip packageMCNC·Filed 1992·Granted Jun 28, 1994·252 cites·29 claims
- 0394US4950623AMethod of building solder bumpsMICROELECTRONICS CENTER OF NOR·Filed 1988·Granted Aug 21, 1990·145 cites·26 claims
- 0492US6166801AMonitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 1998·Granted Dec 26, 2000·154 cites·20 claims
- 0590US7289190B2Monitoring apparatus and method particularly useful in photolithographicallyNOVA MEASURING INSTR LTD·Filed 2006·Granted Oct 30, 2007·9 cites·26 claims
- 0687US6842220B1Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2000·Granted Jan 11, 2005·24 cites·21 claims
- 0786US9616524B2Light induced patterningMATUSOVSKY MIKHAEL·Filed 2009·Granted Apr 11, 2017·15 cites·64 claims
- 0884US9291911B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2014·Granted Mar 22, 2016·3 cites·23 claims
- 0982US7525634B2Monitoring apparatus and method particularly useful in photolithographicallyNOVA MEASURING INSTR LTD·Filed 2007·Granted Apr 28, 2009·4 cites·26 claims
- 1079US7030957B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2004·Granted Apr 18, 2006·13 cites·44 claims
- 1175US4030964ATemperature cycling vapor deposition HgI2 crystal growthUS ENERGY·Filed 1976·Granted Jun 21, 1977·20 cites·5 claims
- 1273US8482715B2Monitoring apparatus and method particularly useful in photolithographically processing substratesDISHON GIORA·Filed 2010·Granted Jul 9, 2013·2 cites·20 claims
- 1366US4094268AApparatus for growing HgI2 crystalsUS ENERGY·Filed 1977·Granted Jun 13, 1978·13 cites·4 claims
- 1461US8780320B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2013·Granted Jul 15, 2014·0 cites·26 claims
- 1561US7821614B2Monitoring apparatus and method particularly useful in photolithographically processing substratesNOVA MEASURING INSTR LTD·Filed 2009·Granted Oct 26, 2010·0 cites·19 claims
- 1644US2012268939A1Method of laser processingFINAROV MOSHE·Filed 2012·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →