Inventor · disambiguated record
Giuseppe La Rosa
Also filed as: LA ROSA GIUSEPPE
10 granted patents·1 pending application·149 citations·filing 1999–2022
89Inventor score
Files withIBM11
Top patents by PatentIndex Score
11 records- 0190US6521469B1Line monitoring of negative bias temperature instabilities by hole injection methodsIBM·Filed 2000·Granted Feb 18, 2003·63 cites·20 claims
- 0286US7710141B2Method and apparatus for dynamic characterization of reliability wearout mechanismsIBM·Filed 2008·Granted May 4, 2010·14 cites·19 claims
- 0377US7375371B2Structure and method for thermally stressing or testing a semiconductor deviceIBM·Filed 2006·Granted May 20, 2008·9 cites·18 claims
- 0475US7805274B2Structure and methodology for characterizing device self-heatingIBM·Filed 2006·Granted Sep 28, 2010·4 cites·18 claims
- 0568US6724053B1PMOSFET device with localized nitrogen sidewall implantationIBM·Filed 2000·Granted Apr 20, 2004·12 cites·9 claims
- 0667US6049495AAuto-programmable current limiter to control current leakage due to bitline to wordline shortIBM·Filed 1999·Granted Apr 11, 2000·26 cites·24 claims
- 0764US9882377B2Electrostatic discharge protection solutionsIBM·Filed 2015·Granted Jan 30, 2018·1 cites·19 claims
- 0857US6348394B1Method and device for array threshold voltage control by trapped charge in trench isolationIBM·Filed 2000·Granted Feb 19, 2002·7 cites·21 claims
- 0954US7023041B2Trench capacitor vertical structureIBM·Filed 2003·Granted Apr 4, 2006·6 cites·17 claims
- 1053US6958621B2Method and circuit for element wearout recoveryIBM·Filed 2003·Granted Oct 25, 2005·7 cites·20 claims
- 1142US2024203519A1Time dependent dielectric breakdown reliability testing of a sramIBM·Filed 2022·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →