Inventor · disambiguated record
Giovanni Naso
Also filed as: NASO GIOVANNI
33 granted patents·1 pending application·480 citations·filing 1990–2015
97Inventor score
Top patents by PatentIndex Score
34 records- 0194US9030870B2Threshold voltage compensation in a multilevel memoryMOSCHIANO VIOLANTE·Filed 2011·Granted May 12, 2015·15 cites·38 claims
- 0294US5168174ANegative-voltage charge pump with feedback controlTEXAS INSTRUMENTS INC·Filed 1991·Granted Dec 1, 1992·130 cites·8 claims
- 0390US6845029B2Flash cell fuse circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Jan 18, 2005·42 cites·26 claims
- 0489US6654272B2Flash cell fuse circuitMICRON TECHNOLOGY INC·Filed 2001·Granted Nov 25, 2003·49 cites·26 claims
- 0584US9087594B2Memory apparatus, systems, and methodsMOSCHIANO VIOLANTE·Filed 2012·Granted Jul 21, 2015·6 cites·26 claims
- 0680US7002828B2Flash cell fuse circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Feb 21, 2006·21 cites·22 claims
- 0777US7620859B2Filtered register architecture to generate actuator signalsMICRON TECHNOLOGY INC·Filed 2006·Granted Nov 17, 2009·8 cites·11 claims
- 0877US7318181B2ROM-based controller monitor in a memory deviceMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 8, 2008·9 cites·19 claims
- 0977US7145799B2Chip protection register unlockingMICRON TECHNOLOGY INC·Filed 2005·Granted Dec 5, 2006·9 cites·29 claims
- 1075US6977410B2Test mode decoder in a flash memoryMICRON TECHNOLOGY INC·Filed 2004·Granted Dec 20, 2005·16 cites·20 claims
- 1173US5056063AActive sense amplifier with dynamic pre-charge transistorTEXAS INSTRUMENTS INC·Filed 1990·Granted Oct 8, 1991·35 cites·20 claims
- 1272US8275926B2Filtered register architecture to generate actuator signalsNASO GIOVANNI·Filed 2011·Granted Sep 25, 2012·3 cites·17 claims
- 1372US6947323B2Chip protection register unlockingMICRON TECHNOLOGY INC·Filed 2003·Granted Sep 20, 2005·16 cites·47 claims
- 1471US7738310B2Fuse data acquisitionMICRON TECHNOLOGY INC·Filed 2008·Granted Jun 15, 2010·8 cites·28 claims
- 1570US6717862B2Flash memory sector tagging for consecutive sector erase or bank eraseMICRON TECHNOLOGY INC·Filed 2002·Granted Apr 6, 2004·15 cites·26 claims
- 1669US6917545B2Dual bus memory burst architectureMICRON TECHNOLOGY INC·Filed 2003·Granted Jul 12, 2005·14 cites·13 claims
- 1768US5504708AFlash EEPROM array with P-tank insulated from substrate by deep N-tankTEXAS INSTRUMENTS INC·Filed 1995·Granted Apr 2, 1996·21 cites·12 claims
- 1867US7657802B2Data compression read mode for memory testingMICRON TECHNOLOGY INC·Filed 2007·Granted Feb 2, 2010·5 cites·23 claims
- 1964US5411908AFlash EEPROM array with P-tank insulated from substrate by deep N-tankTEXAS INSTRUMENTS INC·Filed 1992·Granted May 2, 1995·19 cites·8 claims
- 2062US9520183B2Threshold voltage compensation in a memoryMICRON TECHNOLOGY INC·Filed 2015·Granted Dec 13, 2016·1 cites·20 claims
- 2162US7117402B2Background block erase check for flash memoriesMICRON TECHNOLOGY INC·Filed 2002·Granted Oct 3, 2006·10 cites·36 claims
- 2260US6909641B2Flash memory sector tagging for consecutive sector erase or bank eraseMICRON TECHNOLOGY INC·Filed 2003·Granted Jun 21, 2005·9 cites·18 claims
- 2357US6785162B2Test mode decoder in a flash memoryMICRON TECHNOLOGY INC·Filed 2002·Granted Aug 31, 2004·6 cites·16 claims
- 2455US7434152B2Multiple-level data compression read mode for memory testingMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 7, 2008·3 cites·42 claims
- 2555US7277311B2Flash cell fuse circuitMICRON TECHNOLOGY INC·Filed 2005·Granted Oct 2, 2007·2 cites·20 claims
- 2653US7064582B2Output buffer strength trimmingMICRON TECHNOLOGY INC·Filed 2003·Granted Jun 20, 2006·5 cites·31 claims
- 2752US7934048B2Filtered register architecture to generate actuator signalsMICRON TECHNOLOGY INC·Filed 2009·Granted Apr 26, 2011·0 cites·20 claims
- 2849US9646683B2Memory apparatus, systems, and methodsMICRON TECHNOLOGY INC·Filed 2015·Granted May 9, 2017·0 cites·20 claims
- 2945US2005280072A1Test mode decoder in a flash memoryMICRON TECHNOLOGY INC·Filed 2005·Application pending·0 cites
- 3044US6977852B2ROM-based controller monitor in a memory deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 20, 2005·3 cites·13 claims
- 3143US7635991B2Output buffer strength trimmingMICRON TECHNOLOGY INC·Filed 2006·Granted Dec 22, 2009·0 cites·9 claims
- 3240US7565587B2Background block erase check for flash memoriesMICRON TECHNOLOGY INC·Filed 2006·Granted Jul 21, 2009·0 cites·21 claims
- 3339US7164607B2Dual bus memory burst architectureMICRON TECHNOLOGY INC·Filed 2005·Granted Jan 16, 2007·0 cites·22 claims
- 3435US7254756B2Data compression read mode for memory testingMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 7, 2007·0 cites·22 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →