Inventor · disambiguated record
Gilberto Oseguera
Also filed as: OSEGUERA GILBERTO
18 granted patents·1 pending application·85 citations·filing 2015–2023
91Inventor score
Top patents by PatentIndex Score
19 records- 0198US11587640B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Feb 21, 2023·6 cites·15 claims
- 0298US10656200B2High volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2017·Granted May 19, 2020·35 cites·13 claims
- 0396US11821913B2Shielded socket and carrier for high-volume test of semiconductor devicesADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 21, 2023·4 cites·20 claims
- 0495US11835549B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 5, 2023·3 cites·20 claims
- 0595US11493551B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2020·Granted Nov 8, 2022·28 cites·16 claims
- 0694US12174248B2Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test systemADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 24, 2024·5 cites·20 claims
- 0793US11742055B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Aug 29, 2023·2 cites·20 claims
- 0890US12411167B2Tension-based socket gimbal for engaging device under test with thermal arrayADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Sep 9, 2025·1 cites·20 claims
- 0987US11808812B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 7, 2023·1 cites·20 claims
- 1081US12374420B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jul 29, 2025·0 cites·20 claims
- 1181US12345756B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jul 1, 2025·0 cites·18 claims
- 1281US12320852B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jun 3, 2025·0 cites·20 claims
- 1381US12210056B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 1480US12203958B2Shielded socket and carrier for high-volume test of semiconductor devicesADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 21, 2025·0 cites·17 claims
- 1578US11940487B2Thermal solution for massively parallel testingADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Mar 26, 2024·0 cites·20 claims
- 1674US11841392B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 12, 2023·0 cites·27 claims
- 1772US11549981B2Thermal solution for massively parallel testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 1865US12235314B2Parallel test cell with self actuated socketsADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Feb 25, 2025·0 cites·20 claims
- 1927US2016076992A1Robotically assisted flexible test and inspection systemASTRONICS TEST SYSTEMS INC·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →