Inventor · disambiguated record
Giuseppe Pavia
Also filed as: PAVIA GIUSEPPE
5 granted patents·2 pending applications·23 citations·filing 1998–2019
72Inventor score
Top patents by PatentIndex Score
7 records- 0182US10319560B2Method of determining crystallographic properties of a sample and electron beam microscope for performing the methodZEISS CARL MICROSCOPY GMBH·Filed 2016·Granted Jun 11, 2019·3 cites·22 claims
- 0271US10468229B2Method of generating a zoom sequence and microscope system configured to perform the methodZEISS CARL MICROSCOPY GMBH·Filed 2016·Granted Nov 5, 2019·2 cites·18 claims
- 0345US6197606B1Determination of the thickness of a denuded zone in a silicon waferST MICROELECTRONICS SRL·Filed 1998·Granted Mar 6, 2001·18 cites·23 claims
- 0443US10763076B2Method for operating a particle beam generator for a particle beam device and particle beam device comprising a particle beam generatorZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Sep 1, 2020·0 cites·17 claims
- 0540US10854421B2Charged particle beam system and methodZEISS CARL MICROSCOPY GMBH·Filed 2019·Granted Dec 1, 2020·0 cites·24 claims
- 0628US2015214004A1Method for preparing and analyzing an object as well as particle beam device for performing the methodZEISS CARL MICROSCOPY GMBH·Filed 2015·Application pending·0 cites
- 0728US2013234011A2Method for setting an operating parameter of a particle beam device and a sample holder for performing the methodNIEBEL HARALD·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →