Inventor · disambiguated record
Giovanni Rivera
Also filed as: RIVERA GIOVANNI · RIVERA GIOVANNI G
4 granted patents·1 pending application·66 citations·filing 1992–2019
76Inventor score
Top patents by PatentIndex Score
5 records- 0166US6051443AMethod for assessing the effects of plasma treatments on wafers of semiconductor materialST MICROELECTRONICS SRL·Filed 1997·Granted Apr 18, 2000·40 cites·19 claims
- 0260US5622796AProcess for producing metrological structures particularly for direct measurement of errors introduced by alignment systemsST MICROELECTRONICS SRL·Filed 1994·Granted Apr 22, 1997·17 cites·70 claims
- 0344US2019261706A1Exercise accessoryMANDES ORTIZ MARICARMEN·Filed 2019·Application pending·0 cites
- 0429US5246539AProcess for producing metrological structures particularly useful for analyzing the accuracy of instruments for measuring alignment on processed substratesST MICROELECTRONICS SRL·Filed 1992·Granted Sep 21, 1993·9 cites·23 claims
- 0523US5985494AMetrological structures particularly for direct measurement of errors introduced by alignment systemsSGS THOMSON MICROELECTRONICS·Filed 1995·Granted Nov 16, 1999·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →