Inventor · disambiguated record
Gordon D. Roberts
Also filed as: MILLER JAMES E · ROBERTS GORDON · ROBERTS GORDON D
35 granted patents·596 citations·filing 1996–2004
98Inventor score
Files withMICRON TECHNOLOGY INC35
Top patents by PatentIndex Score
35 records- 0194US6947341B2Integrated semiconductor memory chip with presence detect data capabilityMICRON TECHNOLOGY INC·Filed 2004·Granted Sep 20, 2005·74 cites·10 claims
- 0291US5677567ALeads between chips assemblyMICRON TECHNOLOGY INC·Filed 1996·Granted Oct 14, 1997·93 cites·29 claims
- 0381US5894165ALeads between chips assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Apr 13, 1999·45 cites·8 claims
- 0481US5734661AMethod and apparatus for providing external access to internal integrated circuit test circuitsMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 31, 1998·51 cites·39 claims
- 0580US6008533AControlling impedances of an integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Dec 28, 1999·53 cites·25 claims
- 0678US6028799AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 22, 2000·17 cites·7 claims
- 0776US5877993AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1997·Granted Mar 2, 1999·16 cites·12 claims
- 0875US5770480AMethod of leads between chips assemblyMICRON TECHNOLOGY INC·Filed 1997·Granted Jun 23, 1998·35 cites·15 claims
- 0973US5663919AMemory device with regulated power supply controlMICRON TECHNOLOGY INC·Filed 1996·Granted Sep 2, 1997·26 cites·16 claims
- 1071US6232148B1Method and apparatus leads-between-chipsMICRON TECHNOLOGY INC·Filed 1999·Granted May 15, 2001·31 cites·7 claims
- 1171US5787096ACircuit and method for testing an integrated circuitMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 28, 1998·26 cites·20 claims
- 1269US6778452B2Circuit and method for voltage regulation in a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2003·Granted Aug 17, 2004·6 cites·10 claims
- 1368US5923672AMultipath antifuse circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 13, 1999·27 cites·27 claims
- 1467US5936974ACircuit and method for testing an integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Aug 10, 1999·22 cites·15 claims
- 1562US7152143B2Integrated semiconductor memory chip with presence detect data capabilityMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 19, 2006·6 cites·15 claims
- 1661US6011731ACell plate regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Jan 4, 2000·7 cites·16 claims
- 1758US6052322AMemory circuit voltage regulatorMICRON TECHNOLOGY INC·Filed 1999·Granted Apr 18, 2000·6 cites·5 claims
- 1854US6625692B1Integrated semiconductor memory chip with presence detect data capabilityMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 23, 2003·20 cites·33 claims
- 1952US6181617B1Method and apparatus for testing a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Jan 30, 2001·2 cites·4 claims
- 2051US5907518AMemory device with regulated power supply controlMICRON TECHNOLOGY INC·Filed 1997·Granted May 25, 1999·10 cites·23 claims
- 2150US6111806AMemory device with regulated power supply controlMICRON TECHNOLOGY INC·Filed 1999·Granted Aug 29, 2000·9 cites·16 claims
- 2246US6188622B1Method of identifying a defect within a memory circuitMICRON TECHNOLOGY INC·Filed 2000·Granted Feb 13, 2001·1 cites·4 claims
- 2346US5982687AMethod of detecting leakage within a memory cell capacitorMICRON TECHNOLOGY INC·Filed 1999·Granted Nov 9, 1999·3 cites·5 claims
- 2444US5976911AControlling impedances of an integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 2, 1999·9 cites·15 claims
- 2540US6882587B2Method of preparing to test a capacitorMICRON TECHNOLOGY INC·Filed 2004·Granted Apr 19, 2005·0 cites·5 claims
- 2639US6600687B2Method of compensating for a defect within a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2002·Granted Jul 29, 2003·0 cites·1 claims
- 2738US6469944B2Method of compensating for a defect within a semiconductor deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Oct 22, 2002·0 cites·4 claims
- 2838US6445629B2Method of stressing a memory deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Sep 3, 2002·0 cites·1 claims
- 2938US6418071B2Method of testing a memory cellMICRON TECHNOLOGY INC·Filed 2000·Granted Jul 9, 2002·0 cites·2 claims
- 3038US6353564B1Method of testing a memory arrayMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 5, 2002·0 cites·5 claims
- 3138US6226210B1Method of detecting a short from a digit line pair to groundMICRON TECHNOLOGY INC·Filed 2000·Granted May 1, 2001·0 cites·5 claims
- 3238US6198676B1Test deviceMICRON TECHNOLOGY INC·Filed 2000·Granted Mar 6, 2001·0 cites·3 claims
- 3337US6026040AMethod of altering the margin affecting a memory cellMICRON TECHNOLOGY INC·Filed 1999·Granted Feb 15, 2000·1 cites·8 claims
- 3430US6235622B1Method and apparatus for isolating a conductive region from a substrate during manufacture of an integrated circuit and connected to the substrate after manufactureMICRON TECHNOLOGY INC·Filed 1999·Granted May 22, 2001·0 cites·16 claims
- 3530US6137119AApparatus for isolating a conductive region from a substrate during manufacture of an integrated circuit and connecting the conductive region to the substrate after manufactureMICRON TECHNOLOGY INC·Filed 1998·Granted Oct 24, 2000·0 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →