Inventor · disambiguated record
Gregory A. Barnett
Also filed as: BARNETT GREGORY A
10 granted patents·276 citations·filing 1996–2012
92Inventor score
Top patents by PatentIndex Score
10 records- 0191US5856923AMethod for continuous, non lot-based integrated circuit manufacturingMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 5, 1999·97 cites·26 claims
- 0288US8315730B2Methods for non lot-based integrated circuit manufacturingJONES MARK L·Filed 2010·Granted Nov 20, 2012·7 cites·19 claims
- 0385US6427092B1Method for continuous, non lot-based integrated circuit manufacturingMICRON TECHNOLOGY INC·Filed 1998·Granted Jul 30, 2002·56 cites·24 claims
- 0479US8600540B2Methods for non-lot-based manufacturing of articlesJONES MARK L·Filed 2012·Granted Dec 3, 2013·3 cites·19 claims
- 0577US7738988B2Process and method for continuous, non lot-based integrated circuit manufacturingMICRON TECHNOLOGY INC·Filed 2007·Granted Jun 15, 2010·5 cites·20 claims
- 0671US5927503ATray for processing and/or shipping integrated circuit deviceMICRON TECHNOLOGY INC·Filed 1997·Granted Jul 27, 1999·33 cites·25 claims
- 0770US5935264AMethod and apparatus for determining a set of tests for integrated circuit testingMICRON TECHNOLOGY INC·Filed 1997·Granted Aug 10, 1999·29 cites·24 claims
- 0869US7555358B2Process and method for continuous, non lot-based integrated circuit manufacturingMICRON TECHNOLOGY INC·Filed 2002·Granted Jun 30, 2009·10 cites·23 claims
- 0962US5731230AMethod for processing and/or shipping integrated circuit devicesMICRON TECHNOLOGY INC·Filed 1996·Granted Mar 24, 1998·23 cites·16 claims
- 1050US6115835AMethod and apparatus for determining a set of tests for integrated circuit testingMICRON TECHNOLOGY INC·Filed 1999·Granted Sep 5, 2000·13 cites·34 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →