Inventor · disambiguated record
Gregory L. Cowan
Also filed as: COWAN GREGORY L
6 granted patents·120 citations·filing 1996–2003
86Inventor score
Files withMICRON TECHNOLOGY INC6
Top patents by PatentIndex Score
6 records- 0181US6546512B1Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 2001·Granted Apr 8, 2003·19 cites·14 claims
- 0275US5787097AOutput data compression scheme for use in testing IC memoriesMICRON TECHNOLOGY INC·Filed 1996·Granted Jul 28, 1998·35 cites·6 claims
- 0371US5864565ASemiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 1997·Granted Jan 26, 1999·25 cites·16 claims
- 0470US6016561AOutput data compression scheme for use in testing IC memoriesMICRON TECHNOLOGY INC·Filed 1998·Granted Jan 18, 2000·27 cites·35 claims
- 0553US6665827B2Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 2003·Granted Dec 16, 2003·4 cites·11 claims
- 0649US6314538B1Semiconductor integrated circuit having compression circuitry for compressing test data, and the test system and method for utilizing the semiconductor integrated circuitMICRON TECHNOLOGY INC·Filed 1998·Granted Nov 6, 2001·10 cites·24 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →