Inventor · disambiguated record
Gregory Cruzan
Also filed as: CRUZAN GREGORY
29 granted patents·5 pending applications·119 citations·filing 2006–2024
95Inventor score
Top patents by PatentIndex Score
34 records- 0198US11587640B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Feb 21, 2023·6 cites·15 claims
- 0298US11573262B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Feb 7, 2023·9 cites·21 claims
- 0398US10656200B2High volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2017·Granted May 19, 2020·35 cites·13 claims
- 0497US11674999B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Jun 13, 2023·10 cites·25 claims
- 0596US11852678B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 26, 2023·2 cites·21 claims
- 0696US11567119B2Testing system including active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jan 31, 2023·10 cites·14 claims
- 0795US11835549B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 5, 2023·3 cites·20 claims
- 0895US11754620B2DUT placement and handling for active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Sep 12, 2023·2 cites·24 claims
- 0995US11493551B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2020·Granted Nov 8, 2022·28 cites·16 claims
- 1094US12174248B2Ergonomic loading for a test interface board (TIB) / burn-in-board (BIB) in a slot-based test systemADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 24, 2024·5 cites·20 claims
- 1193US11742055B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Aug 29, 2023·2 cites·20 claims
- 1290US12411167B2Tension-based socket gimbal for engaging device under test with thermal arrayADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Sep 9, 2025·1 cites·20 claims
- 1388US2025093408A1Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 1487US11808812B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Nov 7, 2023·1 cites·20 claims
- 1587US2025130276A1Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 1685US2025102565A1Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 1783US12216154B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Feb 4, 2025·0 cites·20 claims
- 1882US12203979B2Multi-input multi-zone thermal control for device testingADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 21, 2025·0 cites·20 claims
- 1981US12374420B2Carrier based high volume system level testing of devices with pop structuresADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jul 29, 2025·0 cites·20 claims
- 2081US12345756B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jul 1, 2025·0 cites·18 claims
- 2181US12320852B2Passive carrier-based device delivery for slot-based high-volume semiconductor test systemADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jun 3, 2025·0 cites·20 claims
- 2281US12210056B2Thermal array with gimbal features and enhanced thermal performanceADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Jan 28, 2025·0 cites·20 claims
- 2379US11846669B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 19, 2023·0 cites·29 claims
- 2479US11774492B2Test system including active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Oct 3, 2023·0 cites·23 claims
- 2578US11940487B2Thermal solution for massively parallel testingADVANTEST TEST SOLUTIONS INC·Filed 2023·Granted Mar 26, 2024·0 cites·20 claims
- 2677US11609266B2Active thermal interposer deviceADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Mar 21, 2023·0 cites·18 claims
- 2775US12320841B2Wafer scale active thermal interposer for device testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jun 3, 2025·0 cites·27 claims
- 2874US11841392B2Integrated test cell using active thermal interposer (ATI) with parallel socket actuationADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Dec 12, 2023·0 cites·27 claims
- 2972US11549981B2Thermal solution for massively parallel testingADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted Jan 10, 2023·0 cites·20 claims
- 3069US7661276B1EvaporatorEADS NORTH AMERICA INC·Filed 2006·Granted Feb 16, 2010·5 cites·19 claims
- 3165US12235314B2Parallel test cell with self actuated socketsADVANTEST TEST SOLUTIONS INC·Filed 2022·Granted Feb 25, 2025·0 cites·20 claims
- 3260US11656273B1High current device testing apparatus and systemsADVANTEST TEST SOLUTIONS INC·Filed 2021·Granted May 23, 2023·0 cites·26 claims
- 3356US2024183897A1Wafer scale active thermal interposer with thermal isolation structuresADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
- 3456US2024183898A1Active thermal interposer device with thermal isolation structuresADVANTEST TEST SOLUTIONS INC·Filed 2024·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →