Inventor · disambiguated record
Gregory F. Taylor
Also filed as: TAYLOR GREGORY · TAYLOR GREGORY F
53 granted patents·2 pending applications·1,436 citations·filing 1988–2016
99Inventor score
Top patents by PatentIndex Score
55 records- 0197US6157206AOn-chip terminationINTEL CORP·Filed 1998·Granted Dec 5, 2000·221 cites·20 claims
- 0293US6535047B2Apparatus and method to use a single reference component in a master-slave configuration for multiple circuit compensationINTEL CORP·Filed 2001·Granted Mar 18, 2003·53 cites·26 claims
- 0391US6671847B1I/O device testing method and apparatusINTEL CORP·Filed 2000·Granted Dec 30, 2003·73 cites·23 claims
- 0490US7417459B2On-die offset reference circuit blockINTEL CORP·Filed 2005·Granted Aug 26, 2008·21 cites·14 claims
- 0590US6748549B1Clocking an I/O buffer, having a selectable phase difference from the system clock, to and from a remote I/O buffer clocked in phase with the system clockINTEL CORP·Filed 2000·Granted Jun 8, 2004·48 cites·29 claims
- 0690US6452502B1Method and apparatus for early detection of reliability degradation of electronic devicesINTEL CORP·Filed 1999·Granted Sep 17, 2002·78 cites·28 claims
- 0789US6085345ATiming control for input/output testabilityINTEL CORP·Filed 1997·Granted Jul 4, 2000·63 cites·8 claims
- 0888US6717455B2Apparatus and method to use a single reference component in a master-slave configuration for multiple circuit compensationINTEL CORP·Filed 2003·Granted Apr 6, 2004·33 cites·16 claims
- 0987US6124755AMethod and apparatus for biasing a charge pumpINTEL CORP·Filed 1997·Granted Sep 26, 2000·73 cites·6 claims
- 1087US5539337AClock noise filter for integrated circuitsINTEL CORP·Filed 1994·Granted Jul 23, 1996·45 cites·47 claims
- 1186US7049865B2Power-on detect circuit for use with multiple voltage domainsINTEL CORP·Filed 2004·Granted May 23, 2006·32 cites·33 claims
- 1286US6236695B1Output buffer with timing feedbackINTEL CORP·Filed 1999·Granted May 22, 2001·52 cites·19 claims
- 1385US6396309B1Clocked sense amplifier flip flop with keepers to prevent floating nodesINTEL CORP·Filed 2001·Granted May 28, 2002·33 cites·20 claims
- 1484US8827550B2Thermal sensor using a vibrating MEMS resonator of a chip interconnect layerABDELMONEUM MOHAMED A·Filed 2009·Granted Sep 9, 2014·17 cites·18 claims
- 1584US6874083B2Method and apparatus to ensure proper voltage and frequency configuration signals are defined before applying power to processorINTEL CORP·Filed 2000·Granted Mar 29, 2005·41 cites·17 claims
- 1682US10247624B2Self-calibrated thermal sensors of an integrated circuit dieINTEL CORP·Filed 2016·Granted Apr 2, 2019·2 cites·20 claims
- 1782US6075285ASemiconductor package substrate with power dieINTEL CORP·Filed 1997·Granted Jun 13, 2000·53 cites·8 claims
- 1881US6410990B2Integrated circuit device having C4 and wire bond connectionsINTEL CORP·Filed 1997·Granted Jun 25, 2002·57 cites·2 claims
- 1978US6573764B1Method and apparatus for voltage-mode differential simultaneous bi-directional signalingINTEL CORP·Filed 2001·Granted Jun 3, 2003·24 cites·32 claims
- 2077US7394274B2On-chip frequency degradation compensationINTEL CORP·Filed 2007·Granted Jul 1, 2008·7 cites·18 claims
- 2176US6727597B2Integrated circuit device having C4 and wire bond connectionsINTEL CORP·Filed 2001·Granted Apr 27, 2004·20 cites·13 claims
- 2276US6208169B1Internal clock jitter detectorINTEL CORP·Filed 1999·Granted Mar 27, 2001·40 cites·30 claims
- 2374US4972362AMethod and apparatus for implementing binary multiplication using booth type multiplicationBIPOLAR INTEGRATED TECHNOLOGY·Filed 1988·Granted Nov 20, 1990·51 cites·28 claims
- 2472US7112979B2Testing arrangement to distribute integrated circuitsINTEL CORP·Filed 2002·Granted Sep 26, 2006·12 cites·14 claims
- 2571US9702769B2Self-calibrated thermal sensors of an integrated circuit dieINTEL CORP·Filed 2013·Granted Jul 11, 2017·2 cites·20 claims
- 2670US6792489B2Multistage configuration and power settingINTEL CORP·Filed 2001·Granted Sep 14, 2004·15 cites·14 claims
- 2770US5748033ADifferential power bus comparatorINTEL CORP·Filed 1996·Granted May 5, 1998·27 cites·11 claims
- 2869US6584591B1Timing control for input/output testabilityINTEL CORP·Filed 2000·Granted Jun 24, 2003·11 cites·8 claims
- 2968US5801561APower-on initializing circuitINTEL CORP·Filed 1997·Granted Sep 1, 1998·22 cites·17 claims
- 3067US7233162B2Arrangements having IC voltage and thermal resistance designated on a per IC basisINTEL CORP·Filed 2005·Granted Jun 19, 2007·3 cites·14 claims
- 3166US8314725B2On-die digital-to-analog conversion testingZEPEDA PAOLA·Filed 2010·Granted Nov 20, 2012·6 cites·17 claims
- 3266US7501845B2On-chip frequency degradation compensationINTEL CORP·Filed 2008·Granted Mar 10, 2009·3 cites·15 claims
- 3365US5153848AFloating point processor with internal free-running clockBIPOLAR INTEGRATED TECHNOLOGY·Filed 1990·Granted Oct 6, 1992·48 cites·25 claims
- 3462US4982352AMethods and apparatus for determining the absolute value of the difference between binary operandsBIPOLAR INTEGRATED TECHNOLOGY·Filed 1989·Granted Jan 1, 1991·28 cites·7 claims
- 3559US7282937B2On-chip frequency degradation compensationINTEL CORP·Filed 2003·Granted Oct 16, 2007·6 cites·4 claims
- 3655US7348790B2AC testing of leakage current in integrated circuits using RC time constantINTEL CORP·Filed 2005·Granted Mar 25, 2008·2 cites·14 claims
- 3755US6885231B2Variable delay element for use in delay tuning of integrated circuitsINTEL CORP·Filed 2003·Granted Apr 26, 2005·7 cites·6 claims
- 3855US5306964AReference generator circuit for BiCMOS ECL gate employing PMOS load devicesINTEL CORP·Filed 1993·Granted Apr 26, 1994·12 cites·10 claims
- 3953US7889587B2Fuse programming schemes for robust yieldINTEL CORP·Filed 2006·Granted Feb 15, 2011·2 cites·12 claims
- 4053US6781428B2Input circuit with switched reference signalsINTEL CORP·Filed 2001·Granted Aug 24, 2004·6 cites·29 claims
- 4153US5399918ALarge fan-in, dynamic, bicmos logic gateINTEL CORP·Filed 1993·Granted Mar 21, 1995·11 cites·24 claims
- 4253US5345120ASwing limiting circuit for BiCMOS sense amplifiersINTEL CORP·Filed 1993·Granted Sep 6, 1994·11 cites·5 claims
- 4352US7109737B2Arrangements having IC voltage and thermal resistance designated on a per IC basisINTEL CORP·Filed 2004·Granted Sep 19, 2006·4 cites·14 claims
- 4450US8331186B2Fuse programming schemes for robust yieldHE JUN·Filed 2011·Granted Dec 11, 2012·0 cites·11 claims
- 4550US5627736APower supply noise filterINTEL CORP·Filed 1995·Granted May 6, 1997·16 cites·20 claims
- 4648US6691241B1Delay tuning to improve timing in multi-load systemsINTEL CORP·Filed 1999·Granted Feb 10, 2004·19 cites·17 claims
- 4743US6453421B1Processor system with power supply selection mechanismINTEL CORP·Filed 1999·Granted Sep 17, 2002·14 cites·22 claims
- 4842US2007157049A1Adjusting input output timingKIM SONGMIN·Filed 2005·Application pending·0 cites
- 4941US7199624B2Phase locked loop system capable of deskewingINTEL CORP·Filed 2003·Granted Apr 3, 2007·2 cites·15 claims
- 5041US6967496B2AC testing of leakage current in integrated circuits using RC time constantINTEL CORP·Filed 2004·Granted Nov 22, 2005·2 cites·26 claims
Showing the top 50 of 55 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →