Inventor · disambiguated record
Guenter Doemens
Also filed as: DOEMENS GUEENTER · DOEMENS GUENTER
23 granted patents·509 citations·filing 1979–2003
97Inventor score
Top patents by PatentIndex Score
23 records- 0195US4238780AProcess and an apparatus for automatically recognizing the position of semiconductor elementsSIEMENS AG·Filed 1979·Granted Dec 9, 1980·62 cites·33 claims
- 0286US6636300B2Spatially resolving range-finding systemSIEMENS AG·Filed 2001·Granted Oct 21, 2003·70 cites·14 claims
- 0383US4253112AProcess for automatic alignment of two objects to be adjusted with respect to one anotherSIEMENS AG·Filed 1979·Granted Feb 24, 1981·30 cites·32 claims
- 0480US4967148AApparatus for electrical function testing of wiring matrices, particularly of printed circuit boardsSIEMENS AG·Filed 1989·Granted Oct 30, 1990·32 cites·11 claims
- 0577US6614536B1Arrangement and method for simultaneous measurement of the speed as well as the surface shape of moving objectsSIEMENS AG·Filed 2000·Granted Sep 2, 2003·53 cites·24 claims
- 0676US4897598AApparatus for electrical function testing of wiring matrices, particularly of printed circuit boardsSIEMENS AG·Filed 1988·Granted Jan 30, 1990·28 cites·11 claims
- 0774US4941363ASensor for measurement of the torque acting on a rotating shaftSIEMENS AG·Filed 1989·Granted Jul 17, 1990·33 cites·36 claims
- 0871US6791698B2Confocal imaging system having a divided retroreflectorSIEMENS AG·Filed 2001·Granted Sep 14, 2004·13 cites·43 claims
- 0963US4600878AApparatus for testing electrical microprinted circuits utilizing ionizing gas for providing electrical connectionsSIEMENS AG·Filed 1983·Granted Jul 15, 1986·17 cites·3 claims
- 1063US4305097AAutomated opto-electronic test system for quality control of two-dimensional elements with high geometric figure densitySIEMENS AG·Filed 1980·Granted Dec 8, 1981·21 cites·20 claims
- 1161US4814626AMethod for high precision position measurement of two-dimensional structuresSIEMENS AG·Filed 1986·Granted Mar 21, 1989·16 cites·7 claims
- 1257US6229473B1Arrangements for the one-dimensional or multi-dimensional determination of the position of a load suspension point in hoistsSIEMENS AG·Filed 1999·Granted May 8, 2001·14 cites·9 claims
- 1356US6249598B1Solder testing apparatusHITACHI LTD·Filed 1997·Granted Jun 19, 2001·21 cites·21 claims
- 1451US4891578ADevice for the electrical function testing of wiring matrices, particularly of printed circuit boardsSIEMENS AG·Filed 1988·Granted Jan 2, 1990·12 cites·23 claims
- 1550US4967149ADrive device for an apparatus for electrical function testing of wiring matricesSIEMENS AG·Filed 1988·Granted Oct 30, 1990·14 cites·9 claims
- 1650US4863280AIntegral temperature measurement in electrical machines, transformers and energy conversion systemsSIEMENS AG·Filed 1988·Granted Sep 5, 1989·13 cites·19 claims
- 1749US6865960B2Capacitive microsystem for recording mechanical deformations, use and operating methodSIEMENS AG·Filed 2003·Granted Mar 15, 2005·13 cites·11 claims
- 1848US5088828AMethod and apparatus for three-dimensional testing of printed circuitboardsSIEMENS AG·Filed 1990·Granted Feb 18, 1992·13 cites·5 claims
- 1943US4777432ADevice for electrically checking printed circuit boardsSIEMENS AG·Filed 1986·Granted Oct 11, 1988·11 cites·20 claims
- 2039US6028432AArrangement for the one-dimensional or multi-dimensional determination of the position of a load suspension point in hoistsSIEMENS AG·Filed 1997·Granted Feb 22, 2000·11 cites·18 claims
- 2139US4934198ADisplacement and torque sensor using resistance element that is progressively shortedSIEMENS AG·Filed 1988·Granted Jun 19, 1990·7 cites·17 claims
- 2234US4904067ASelection deviceSIEMENS AG·Filed 1988·Granted Feb 27, 1990·4 cites·13 claims
- 2332US6772647B2Actuator-integrated force sensorPACIFICA GROUP TECHNOLOGIES PT·Filed 2000·Granted Aug 10, 2004·1 cites·3 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →