Inventor · disambiguated record
Guido Groeseneken
Also filed as: GROESENEKEN GUIDO · GROESENEKEN GUIDO V L
12 granted patents·283 citations·filing 1988–2003
93Inventor score
Top patents by PatentIndex Score
12 records- 0186US6243293B1Contacted cell array configuration for erasable and programmable semiconductor memoriesIMEC INTER UNI MICRO ELECTR·Filed 1999·Granted Jun 5, 2001·66 cites·14 claims
- 0279US6570226B1Device and circuit for electrostatic discharge and overvoltage protection applicationsIMEC INTER UNI MICRO ELECTR·Filed 2000·Granted May 27, 2003·27 cites·39 claims
- 0379US6115285ADevice and method for multi-level charge/storage and reading outSIEMENS AG·Filed 1997·Granted Sep 5, 2000·49 cites·15 claims
- 0476US6044015AMethod of programming a flash EEPROM memory cell array optimized for low power consumptionIMEC VZW·Filed 1996·Granted Mar 28, 2000·32 cites·37 claims
- 0571US5583810AMethod for programming a semiconductor memory deviceIMEC INTER UNI MICRO ELECTR·Filed 1993·Granted Dec 10, 1996·29 cites·2 claims
- 0662US5583811ATransistor structure for erasable and programmable semiconductor memory devicesIMEC INTER UNI MICRO ELECTR·Filed 1994·Granted Dec 10, 1996·19 cites·3 claims
- 0760US5969991AMethod of erasing a flash EEPROM memory cell array optimized for low power consumptionIMEC INTER UNI MICRO ELECTR·Filed 1997·Granted Oct 19, 1999·16 cites·6 claims
- 0857US6009013AContactless array configuration for semiconductor memoriesIMEC INTER UNI MICRO ELECTR·Filed 1995·Granted Dec 28, 1999·18 cites·14 claims
- 0956US6707110B2Layout configurable electrostatic discharge device for integrated circuitsIMEC INTER UNI MICRO ELECTR·Filed 2002·Granted Mar 16, 2004·13 cites·11 claims
- 1048US6282124B1Method of erasing a flash EEPROM memory cell array optimized for low power consumptionIMEC INTER UNI MICRO ELECTR·Filed 1999·Granted Aug 28, 2001·9 cites·3 claims
- 1139US7030461B2Device for electrostatic discharge protectionIMEC INTER UNI MICRO ELECTR·Filed 2003·Granted Apr 18, 2006·2 cites·21 claims
- 1232US5036273ASystem of measuring a state density in a semi-conductor element and a method using this systemIMEC INTER UNI MICRO ELECTR·Filed 1988·Granted Jul 30, 1991·3 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →