Inventor · disambiguated record
Gunnar Krause
Also filed as: KRAUSE GUNNAR · KRAUSE GUNNAR H
31 granted patents·2 pending applications·381 citations·filing 1997–2004
97Inventor score
Top patents by PatentIndex Score
33 records- 0188US6612738B2Method for determining the temperature of a semiconductor chip and semiconductor chip with temperature measuring configurationINFINEON TECHNOLOGIES·Filed 2001·Granted Sep 2, 2003·45 cites·5 claims
- 0287US5959911AApparatus and method for implementing a bank interlock scheme and related test mode for multibank memory devicesSIEMENS AG·Filed 1997·Granted Sep 28, 1999·68 cites·15 claims
- 0383US6973008B2Apparatus for flexible deactivation of word lines of dynamic memory modules and method thereforINFINEON TECHNOLOGIES AG·Filed 2004·Granted Dec 6, 2005·32 cites·20 claims
- 0480US6556492B2System for testing fast synchronous semiconductor circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 29, 2003·31 cites·10 claims
- 0575US6744272B2Test circuitFiled 2002·Granted Jun 1, 2004·25 cites·11 claims
- 0674US6762611B2Test configuration and test method for testing a plurality of integrated circuits in parallelINFINEON TECHOLOGIES AG·Filed 2001·Granted Jul 13, 2004·18 cites·8 claims
- 0765US6971039B2DDR to SDR conversion that decodes read and write accesses and forwards delayed commands to first and second memory modulesINFINEON TECHNOLOGIES AG·Filed 2002·Granted Nov 29, 2005·15 cites·8 claims
- 0865US6853206B2Method and probe card configuration for testing a plurality of integrated circuits in parallelINFINEON TECHNOLOGIES AG·Filed 2003·Granted Feb 8, 2005·11 cites·6 claims
- 0964US6721904B2System for testing fast integrated digital circuits, in particular semiconductor memory modulesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Apr 13, 2004·15 cites·29 claims
- 1061US6871306B2Method and device for reading and for checking the time position of data response signals read out from a memory module to be testedINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 22, 2005·12 cites·20 claims
- 1157US6459649B2Address generator for generating addresses for an on-chip trim circuitINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 1, 2002·9 cites·9 claims
- 1256US6812689B2Method and device for offset-voltage free voltage measurement and adjustment of a reference voltage source of an integrated semiconductor circuitINFINEON TECHNOLOGIES AG·Filed 2001·Granted Nov 2, 2004·7 cites·24 claims
- 1354US6756699B2Device and method for calibrating the pulse duration of a signal sourceINFINEON TECHNOLOGIES AG·Filed 2002·Granted Jun 29, 2004·6 cites·20 claims
- 1453US7117404B2Test circuit for testing a synchronous memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 3, 2006·8 cites·6 claims
- 1553US6728147B2Method for on-chip testing of memory cells of an integrated memory circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Apr 27, 2004·8 cites·12 claims
- 1653US6618305B2Test circuit for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Sep 9, 2003·8 cites·9 claims
- 1753US6313655B1Semiconductor component and method for testing and operating a semiconductor componentINFINEON TECHNOLOGIES AG·Filed 1998·Granted Nov 6, 2001·14 cites·17 claims
- 1848US6865707B2Test data generatorINFINEON TECHNOLOGIES AG·Filed 2002·Granted Mar 8, 2005·6 cites·20 claims
- 1946US6581171B1Circuit configuration for the burn-in test of a semiconductor moduleINFINEON TECHNOLOGIES AG·Filed 2000·Granted Jun 17, 2003·3 cites·10 claims
- 2045US7062690B2System for testing fast synchronous digital circuits, particularly semiconductor memory chipsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 13, 2006·3 cites·16 claims
- 2142US6180992B1Fuse configuration for a semiconductor storage deviceINFINEON TECHNOLOGIES AG·Filed 1998·Granted Jan 30, 2001·7 cites·4 claims
- 2242US6097233AAdjustable delay circuitSIEMENS AG·Filed 1999·Granted Aug 1, 2000·7 cites·7 claims
- 2341US6862702B2Address counter for addressing synchronous high-frequency digital circuits, in particular memory devicesINFINEON TECHNOLOGIES AG·Filed 2001·Granted Mar 1, 2005·3 cites·10 claims
- 2441US6839397B2Circuit configuration for generating control signals for testing high-frequency synchronous digital circuitsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jan 4, 2005·3 cites·11 claims
- 2540US6157589ADynamic semiconductor memory device and method for initializing a dynamic semiconductor memory deviceSIEMENS AG·Filed 1999·Granted Dec 5, 2000·6 cites·13 claims
- 2638US6229343B1Integrated circuit with two operating statesSIEMENS AG·Filed 1999·Granted May 8, 2001·11 cites·7 claims
- 2734US7117403B2Method and device for generating digital signal patternsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Oct 3, 2006·0 cites·18 claims
- 2834US2003005389A1Test circuit for testing a synchronous circuitFiled 2002·Application pending·0 cites
- 2933US6400630B2Circuit configuration having a variable number of data outputs and device for reading out data from the circuit configuration with the variable number of data outputsINFINEON TECHNOLOGIES AG·Filed 2001·Granted Jun 4, 2002·0 cites·15 claims
- 3032US6274410B2Method of programming a semiconductor memoryINFINEON TECHNOLOGIES AG·Filed 2000·Granted Aug 14, 2001·0 cites·1 claims
- 3132US2001046166A1Digital memory circuitFiled 2001·Application pending·0 cites
- 3231US6957373B2Address generator for generating addresses for testing a circuitINFINEON TECHNOLOGIES AG·Filed 2002·Granted Oct 18, 2005·0 cites·10 claims
- 3330US6779124B2Selectively deactivating a first control loop in a dual control loop circuit during data transmissionSIEMENS AG·Filed 2001·Granted Aug 17, 2004·0 cites·5 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →