Inventor · disambiguated record
Gun-Won Lee
Also filed as: LEE GUN-WON
2 granted patents·74 citations·filing 1996–1997
67Inventor score
Top patents by PatentIndex Score
2 records- 0172US6028442ATest circuit for identifying open and short circuit defects in a liquid crystal display and method thereofSAMSUNG ELECTRONICS CO LTD·Filed 1997·Granted Feb 22, 2000·47 cites·21 claims
- 0258US5844421AProbe control method for leveling probe pins for a probe test sequenceSAMSUNG ELECTRONIS CO LTD·Filed 1996·Granted Dec 1, 1998·27 cites·4 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →