Inventor · disambiguated record
Guangze Pan
Also filed as: PAN GUANGZE
3 granted patents·7 pending applications·1 citations·filing 2024–2025
44Inventor score
Files withCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES3CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE THE FIFTH2CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON2CHINA ELECTRONIC PRODUCT REALIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE1CHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIROMENTAL TESTING RES INSTITUTE1
Top patents by PatentIndex Score
10 records- 0180US12079550B1Wiener process-based method and device for processing accelerated degradation testing dataCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2024·Granted Sep 3, 2024·1 cites·11 claims
- 0263US2025014682A1Machine learning with neural networks for reducing bacterial sequence contamination in phage genome constructionsUNIV CITY HONG KONG·Filed 2024·Application pending·0 cites
- 0359US2024255396A1Product Reliability Evaluation Method And Apparatus Based On Multi-Stress Coupling Acceleration ModelCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE THE FIFTH·Filed 2024·Application pending·0 cites
- 0457US12124248B1Method and apparatus for processing accelerated test data based on multiple performance degradation, and computer deviceCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2024·Granted Oct 22, 2024·0 cites·7 claims
- 0557US2024378646A1Method and apparatus for estimating product lifetime based on multi-stress accelerated test, and computer deviceCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIROMENTAL TESTING RES INSTITUTE·Filed 2024·Application pending·0 cites
- 0656US12493070B2Parallel accelerated test method and apparatus that separately applies multiple sensitive stresses to multiple componentsCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RESEARCH INSTITUTE THE FIFTH ELECTRON·Filed 2025·Granted Dec 9, 2025·0 cites·10 claims
- 0755US2024386339A1Accelerated Test Data Analysis Method And Apparatus Based On Gray Forecast Model, And DeviceCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2024·Application pending·0 cites
- 0851US2024378130A1Performance degradation-based product reliability weak link evaluation method and apparatusCHINA ELECTRONIC PRODUCT RELIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE THE FIFTH·Filed 2024·Application pending·0 cites
- 0949US2024338270A1Method and apparatus for reliability evaluation based on multiple performance degradation, and deviceCHINA ELECTRONIC PRODUCT REALIABILITY AND ENVIRONMENTAL TESTING RES INSTITUTE·Filed 2024·Application pending·0 cites
- 1048US2025290830A1Integrated Product Testing Method and Device Combining Accelerated Life Test and Accelerated Degradation TestCHINA ELECTRONIC PROD RELIABILITY & ENVIRONMENTAL TESTING RES INST 5TH ELECTRONIC RES·Filed 2025·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →