Inventor · disambiguated record
Guy Shwartz
Also filed as: SHWARTZ GUY
4 granted patents·3 pending applications·0 citations·filing 2021–2024
52Inventor score
Files withAPPLIED MATERIALS ISRAEL LTD7
Top patents by PatentIndex Score
7 records- 0160US2025116597A1Model-based acousto-optic depth-metrology of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0259US12278085B2Hybrid scanning electron microscopy and acousto-optic based metrologyAPPLIED MATERIALS ISRAEL LTD·Filed 2022·Granted Apr 15, 2025·0 cites·20 claims
- 0359US2025155235A1Depth profiling of semiconductor structures using multi-wavelength pump-probe techniqueAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Application pending·0 cites
- 0458US12456600B2Scanning electron microscopy-based tomography of specimensAPPLIED MATERIALS ISRAEL LTD·Filed 2023·Granted Oct 28, 2025·0 cites·20 claims
- 0555US2025391114A1Algorithm for 3d reconstruction of diagonally cut semiconductor logic structureAPPLIED MATERIALS ISRAEL LTD·Filed 2024·Application pending·0 cites
- 0652US11803961B2Die-to-multi-die wafer inspectionAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Oct 31, 2023·0 cites·20 claims
- 0748US11688055B2Methods and systems for analysis of wafer scan dataAPPLIED MATERIALS ISRAEL LTD·Filed 2021·Granted Jun 27, 2023·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →