Inventor · disambiguated record
Guoqing Xiao
Also filed as: XIAO GUOQING
10 granted patents·1 pending application·231 citations·filing 1988–2015
89Inventor score
Files withCHECKPOINT TECHNOLOGIES LLC8CHECKPOINT TECH LLC1TECHNICAL INSTR COMPANY1UNIV LELAND STANFORD JUNIOR1
Top patents by PatentIndex Score
11 records- 0192US4927254AScanning confocal optical microscope including an angled apertured rotating disc placed between a pinhole and an objective lensUNIV LELAND STANFORD JUNIOR·Filed 1988·Granted May 22, 1990·90 cites·13 claims
- 0284US9217855B1Multi-magnification high sensitivity optical system for probing electronic devicesCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Granted Dec 22, 2015·8 cites·19 claims
- 0382US9030658B1Multi-resolution optical probing system having reliable temperature control and mechanical isolationCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Granted May 12, 2015·6 cites·22 claims
- 0480US9182580B1Optical probe system having accurate positional and orientational adjustments for multiple optical objectivesCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Granted Nov 10, 2015·6 cites·22 claims
- 0579US5537247ASingle aperture confocal imaging systemTECHNICAL INSTR COMPANY·Filed 1994·Granted Jul 16, 1996·61 cites·29 claims
- 0677US6168311B1System and method for optically determining the temperature of a test objectCHECKPOINT TECHNOLOGIES LLC·Filed 1998·Granted Jan 2, 2001·53 cites·39 claims
- 0776US8749784B1Probing circuit features in sub-32 nm semiconductor integrated circuitCHECKPOINT TECHNOLOGIES LLC·Filed 2012·Granted Jun 10, 2014·4 cites·15 claims
- 0875US8873032B1Optical probing system having reliable temperature controlCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Granted Oct 28, 2014·3 cites·20 claims
- 0952US9025147B1Probing circuit features in sub-32 NM semiconductor integrated circuitCHECKPOINT TECHNOLOGIES LLC·Filed 2014·Granted May 5, 2015·0 cites·17 claims
- 1046US2015153232A1Microscope with detector stop matchingCHECKPOINT TECHNOLOGIES LLC·Filed 2013·Application pending·0 cites
- 1124US9417281B1Adjustable split-beam optical probing (ASOP)CHECKPOINT TECH LLC·Filed 2015·Granted Aug 16, 2016·0 cites·23 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →