Inventor · disambiguated record
Gwan Tae Kim
Also filed as: KIM GWAN TAE
2 granted patents·1 pending application·0 citations·filing 2022–2025
24Inventor score
Technology areasH01B
Top patents by PatentIndex Score
3 records- 0174US12487078B2Apparatus for continuously measuring thickness of thin material, method for continuously measuring thickness of thin material using same, and method for manufacturing high-temperature superconducting wire using sameKERI KOREA ELECTROTECHNOLOGY RES INST·Filed 2023·Granted Dec 2, 2025·0 cites·2 claims
- 0272US2025334398A1Apparatus for continuously measuring thickness of thin material, method for continuously measuring thickness of thin material using same, and method for manufacturing high-temperature superconducting wire using sameKOREA ELECTROTECHHOLOGY RES INSTITUTE·Filed 2025·Application pending·0 cites
- 0352US12014842B2High temperature superconductor having multiple superconducting layers, and high temperature superconductor manufacturing method for sameKERI KOREA ELECTROTECHNOLOGY RES INST·Filed 2022·Granted Jun 18, 2024·0 cites·12 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →