Inventor · disambiguated record
Gwangsik Park
Also filed as: PARK GWANGSIK
6 granted patents·4 citations·filing 2018–2022
68Inventor score
Files withSAMSUNG ELECTRONICS CO LTD6
Top patents by PatentIndex Score
6 records- 0191US11726046B2Multi-scale spectral imaging apparatuses and methods, and methods of manufacturing semiconductor devices by using the imaging methodsSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Aug 15, 2023·4 cites·15 claims
- 0269US12045009B2Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHMSAMSUNG ELECTRONICS CO LTD·Filed 2022·Granted Jul 23, 2024·0 cites·11 claims
- 0364US11314205B2Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHMSAMSUNG ELECTRONICS CO LTD·Filed 2018·Granted Apr 26, 2022·0 cites·19 claims
- 0452US11898912B2Hyperspectral imaging (HSI) apparatus and inspection apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2021·Granted Feb 13, 2024·0 cites·20 claims
- 0549US10699927B1Inspection apparatus and semiconductor structure-manufacturing apparatus including the sameSAMSUNG ELECTRONICS CO LTD·Filed 2019·Granted Jun 30, 2020·0 cites·20 claims
- 0643US11264256B2Wafer inspection apparatusSAMSUNG ELECTRONICS CO LTD·Filed 2020·Granted Mar 1, 2022·0 cites·20 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →