Inventor · disambiguated record
Gyokubu Cho
Also filed as: CHO GYOKUBU
15 granted patents·4 pending applications·20 citations·filing 2009–2023
87Inventor score
Top patents by PatentIndex Score
19 records- 0184US10753887B2X-ray CT measuring apparatus and interference prevention method thereofMITUTOYO CORP·Filed 2019·Granted Aug 25, 2020·2 cites·8 claims
- 0284US8957960B2Machine vision system program editing environment including real time context generation featuresSAYLOR BARRY·Filed 2011·Granted Feb 17, 2015·12 cites·41 claims
- 0377US12210722B2Position specifying method and programMITUTOYO CORP·Filed 2023·Granted Jan 28, 2025·0 cites·3 claims
- 0473US11656733B2Position specifying method and programMITUTOYO CORP·Filed 2022·Granted May 23, 2023·0 cites·7 claims
- 0572US9726473B2Light interference measuring device and program thereforMITUTOYO CORP·Filed 2014·Granted Aug 8, 2017·3 cites·12 claims
- 0670US11314374B2Position specifying method and programMITUTOYO CORP·Filed 2021·Granted Apr 26, 2022·0 cites·5 claims
- 0770US10027885B2Image measuring apparatusMITUTOYO CORP·Filed 2015·Granted Jul 17, 2018·2 cites·14 claims
- 0869US11037337B2Method and apparatus for generating measurement plan for measuring X-ray CTMITUTOYO CORP·Filed 2019·Granted Jun 15, 2021·1 cites·7 claims
- 0965US2020210049A1Position specifying method and programMITUTOYO CORP·Filed 2020·Application pending·0 cites
- 1063US10656780B2Position specifying method and programMITUTOYO CORP·Filed 2019·Granted May 19, 2020·0 cites·5 claims
- 1158US10618220B2Object-forming machine, cross-section measurement apparatus, and cross-section measurement methodMITUTOYO CORP·Filed 2019·Granted Apr 14, 2020·0 cites·1 claims
- 1255US11215788B2Variable focal length lens device and variable focal length lens control methodMITUTOYO CORP·Filed 2019·Granted Jan 4, 2022·0 cites·6 claims
- 1352US10343334B2Object-forming machine, cross-section measurement apparatus, and cross-section measurement methodMITUTOYO CORP·Filed 2016·Granted Jul 9, 2019·0 cites·7 claims
- 1443US2019220185A1Image measurement apparatus and computer readable mediumMITUTOYO CORP·Filed 2019·Application pending·0 cites
- 1542US10102631B2Edge detection bias correction value calculation method, edge detection bias correction method, and edge detection bias correcting programMITUTOYO CORP·Filed 2016·Granted Oct 16, 2018·0 cites·6 claims
- 1642US2009303068A1Optical measuring instrumentMITUTOYO CORP·Filed 2009·Application pending·0 cites
- 1737US10642017B2Imaging system and imaging methodMITUTOYO CORP·Filed 2017·Granted May 5, 2020·0 cites·16 claims
- 1835US2016019687A1Image measuring apparatusMITUTOYO CORP·Filed 2015·Application pending·0 cites
- 1934US11257205B2Image measuring method and apparatusMITUTOYO CORP·Filed 2016·Granted Feb 22, 2022·0 cites·30 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →