Inventor · disambiguated record
Haruko Akutsu
Also filed as: AKUTSU HARUKO
12 granted patents·9 pending applications·11 citations·filing 2003–2024
83Inventor score
Top patents by PatentIndex Score
21 records- 0183US8841614B1Sample structure analyzing method, transmission electron microscope, and computer-readable non-transitory recording mediumTOSHIBA KK·Filed 2013·Granted Sep 23, 2014·4 cites·16 claims
- 0271US9431229B2Sputter neutral particle mass spectrometry apparatus with optical elementTOSHIBA KK·Filed 2015·Granted Aug 30, 2016·2 cites·2 claims
- 0364US2024319122A1Electron microscope and crystal evaluation methodKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0462US8748844B2Sample analyzing apparatus and sample analyzing methodAKUTSU HARUKO·Filed 2012·Granted Jun 10, 2014·2 cites·15 claims
- 0562US7495293B2Semiconductor device and method for manufacturing the sameTOSHIBA KK·Filed 2006·Granted Feb 24, 2009·2 cites·12 claims
- 0658US2024321566A1Mass spectrometerKIOXIA CORP·Filed 2024·Application pending·0 cites
- 0751US7145658B2Apparatus and method for evaluating semiconductor materialTOSHIBA KK·Filed 2003·Granted Dec 5, 2006·1 cites·4 claims
- 0847US10916405B2Atom probe inspection device, field ion microscope, and distortion correction methodTOSHIBA MEMORY CORP·Filed 2019·Granted Feb 9, 2021·0 cites·18 claims
- 0945US11062894B2Mass spectrometer and mass spectrometry methodTOSHIBA KK·Filed 2019·Granted Jul 13, 2021·0 cites·4 claims
- 1045US9734985B2Analytical apparatus, sample holder and analytical methodTOSHIBA KK·Filed 2016·Granted Aug 15, 2017·0 cites·14 claims
- 1145US9287104B2Material inspection apparatus and material inspection methodTOSHIBA KK·Filed 2013·Granted Mar 15, 2016·0 cites·4 claims
- 1245US2015279645A1Mass spectroscope and mass spectrometryTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1345US2015012229A1Sample analysis apparatus, non-transitory computer-readable recording medium and sample analysis methodTOSHIBA KK·Filed 2014·Application pending·0 cites
- 1445US2015041652A1Material inspection apparatusTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1543US7557040B2Method of manufacture of semiconductor deviceTOSHIBA KK·Filed 2006·Granted Jul 7, 2009·0 cites·15 claims
- 1643US2009243002A1Semiconductor device and method of fabricating the sameTOSHIBA KK·Filed 2009·Application pending·0 cites
- 1742US2014070110A1Atom probe measuring apparatus and methodTOSHIBA KK·Filed 2013·Application pending·0 cites
- 1840US10345336B2Scanning probe microscope and measurement method using the sameTOSHIBA MEMORY CORP·Filed 2016·Granted Jul 9, 2019·0 cites·12 claims
- 1934US10553416B2Mass spectrometer performing mass spectrometry for sample with laser irradiationTOSHIBA MEMORY CORP·Filed 2016·Granted Feb 4, 2020·0 cites·12 claims
- 2032US2011053058A1Semiconductor device fabrication mask and method of manufacturing the sameOTSUBO KYO·Filed 2010·Application pending·0 cites
- 2130US2011100393A1Method of cleaning mask and mask cleaning apparatusUEMURA ERI·Filed 2010·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →