Inventor · disambiguated record
Hanmant P. Belgal
Also filed as: BELGAL HANMANT · BELGAL HANMANT P · BELGAL HANMANT PRAMOD
14 granted patents·2 pending applications·116 citations·filing 2011–2018
91Inventor score
Top patents by PatentIndex Score
16 records- 0197US9824767B1Methods and apparatus to reduce threshold voltage driftINTEL CORP·Filed 2016·Granted Nov 21, 2017·25 cites·27 claims
- 0294US9613691B2Apparatus and method for drift cancellation in a memoryINTEL CORP·Filed 2015·Granted Apr 4, 2017·20 cites·20 claims
- 0393US8510636B2Dynamic read channel calibration for non-volatile memory devicesRUBY PAUL D·Filed 2011·Granted Aug 13, 2013·33 cites·13 claims
- 0484US8954650B2Apparatus, system, and method for improving read endurance for a non-volatile memoryBELGAL HANMANT P·Filed 2011·Granted Feb 10, 2015·11 cites·30 claims
- 0583US9384801B2Threshold voltage expansionINTEL CORP·Filed 2014·Granted Jul 5, 2016·8 cites·22 claims
- 0679US8792283B2Extended select gate lifetimeWAKCHAURE YOGESH B·Filed 2012·Granted Jul 29, 2014·5 cites·13 claims
- 0777US8650353B2Apparatus, system, and method for refreshing non-volatile memoryBELGAL HANMANT P·Filed 2011·Granted Feb 11, 2014·7 cites·23 claims
- 0874US9030885B2Extended select gate lifetimeINTEL CORP·Filed 2014·Granted May 12, 2015·3 cites·15 claims
- 0966US10163502B2Selective performance level modes of operation in a non-volatile memoryINTEL CORP·Filed 2016·Granted Dec 25, 2018·2 cites·22 claims
- 1064US9183091B2Configuration information backup in memory systemsINTEL CORP·Filed 2012·Granted Nov 10, 2015·1 cites·19 claims
- 1157US9817600B2Configuration information backup in memory systemsINTEL CORP·Filed 2016·Granted Nov 14, 2017·0 cites·20 claims
- 1255US2019122729A1Selective performance level modes of operation in a non-volatile memoryINTEL CORP·Filed 2018·Application pending·0 cites
- 1354US9552159B2Configuration information backup in memory systemsINTEL CORP·Filed 2015·Granted Jan 24, 2017·0 cites·12 claims
- 1454US8929151B2Extended select gate lifetimeWAKCHAURE YOGESH·Filed 2014·Granted Jan 6, 2015·1 cites·5 claims
- 1546US9490018B2Extended select gate lifetimeINTEL CORP·Filed 2015·Granted Nov 8, 2016·0 cites·15 claims
- 1631US2017160338A1Integrated circuit reliability assessment apparatus and methodINTEL CORP·Filed 2015·Application pending·0 cites
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →