Inventor · disambiguated record
Hans-Detlef Brust
Also filed as: BRUST HANS D · BRUST HANS-DETLEF
23 granted patents·315 citations·filing 1985–1999
96Inventor score
Top patents by PatentIndex Score
23 records- 0173US6650999B1Method and device for finding a parked vehicleBRUST HANS-DETLEF·Filed 1999·Granted Nov 18, 2003·123 cites·28 claims
- 0273US4803357AMethod and arrangement for detecting secondary particles triggered on a specimen by a primary particle beamSIEMENS AG·Filed 1987·Granted Feb 7, 1989·18 cites·18 claims
- 0372US4812748AMethod and apparatus for operating a scanning microscopeSIEMENS AG·Filed 1986·Granted Mar 14, 1989·15 cites·9 claims
- 0465US5260648AProcess and system for rapid analysis of the spectrum of a signal at one or several points of measuringBRUST HANS DETLEF·Filed 1990·Granted Nov 9, 1993·26 cites·20 claims
- 0564US4902966AMethod and apparatus for operating a scanning microscopeSIEMENS AG·Filed 1988·Granted Feb 20, 1990·10 cites·9 claims
- 0663US4752686AMethod and apparatus for emphasizing a specimen surface region scanned by a scanning microscope primary beamSIEMENS AG·Filed 1986·Granted Jun 21, 1988·12 cites·32 claims
- 0757US4745362AMethod and apparatus for detecting and imaging a voltage signal of at least one specific frequency at a measuring locationSIEMENS AG·Filed 1985·Granted May 17, 1988·13 cites·29 claims
- 0856US4677351ACircuit for preventing burn-in spots on the picture screen of a visual displaySIEMENS AG·Filed 1985·Granted Jun 30, 1987·9 cites·17 claims
- 0951US4820977AMethod and apparatus for identifying points on a specimen having a defined time-dependent signalSIEMENS AG·Filed 1986·Granted Apr 11, 1989·12 cites·30 claims
- 1048US4853622AMethod and apparatus for detecting and imaging a voltage signal of at least one specific frequency at a measuring locationSIEMENS AG·Filed 1988·Granted Aug 1, 1989·9 cites·1 claims
- 1146US4689555AMethod for the determination of points on a specimen carrying a specific signal frequency by use of a scanning microscopeSIEMENS AG·Filed 1986·Granted Aug 25, 1987·10 cites·35 claims
- 1245US5281909AProcess and system for measuring the course of a signal at a point of measurement on a sampleBRUST HANS DETLEF·Filed 1988·Granted Jan 25, 1994·9 cites·40 claims
- 1344US4887031AMethod and apparatus for detecting and imaging measuring points that have a defined signal progressionSIEMENS AG·Filed 1988·Granted Dec 12, 1989·7 cites·14 claims
- 1442US5185571AProcess and system for the asynchronous measurement of signal coursesBRUST HANS DETLEF·Filed 1989·Granted Feb 9, 1993·8 cites·29 claims
- 1538US4831328AMeasurement processing arrangementBRUST HANS DETLEF·Filed 1987·Granted May 16, 1989·6 cites·7 claims
- 1637US4954773AVoltage measurement with an electron probe without external trigger signalSIEMENS AG·Filed 1988·Granted Sep 4, 1990·5 cites·22 claims
- 1735US4967150AMethod and apparatus for phase measurement of signals at a measuring point by an unmodulated particle beamSIEMENS AG·Filed 1988·Granted Oct 30, 1990·4 cites·35 claims
- 1834US4972142AAutomatic frequency follow-up in particle beam metrology upon employment of a modulated primary beamSIEMENS AG·Filed 1988·Granted Nov 20, 1990·4 cites·33 claims
- 1934US4902963AMethod and arrangement for recording periodic signals with a laser probeBRUST HANS D·Filed 1989·Granted Feb 20, 1990·6 cites·11 claims
- 2034US4678988AMethod and apparatus for spectral analysis of a signal at a measuring pointSIEMENS AG·Filed 1985·Granted Jul 7, 1987·4 cites·13 claims
- 2132US5424961AProcess and system for measuring the temporal course of a periodic signal having high time resolution according to a "Boxcar-like" processFiled 1994·Granted Jun 13, 1995·2 cites·27 claims
- 2230US4780669AMethod and arrangement for evaluating a test voltage by means of a bandwidth-limited evaluation circuitSIEMENS AG·Filed 1986·Granted Oct 25, 1988·2 cites·10 claims
- 2330US4771235AMethod and apparatus for detecting and imaging measuring points that have a defined signal progressionSIEMENS AG·Filed 1985·Granted Sep 13, 1988·1 cites·16 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →