Inventor · disambiguated record
Hauyee Chang
Also filed as: CHANG HAUYEE
5 granted patents·166 citations·filing 1999–2020
81Inventor score
Top patents by PatentIndex Score
5 records- 0196US8068579B1Process for examining mineral samples with X-ray microscope and projection systemsYUN WENBING·Filed 2009·Granted Nov 29, 2011·112 cites·29 claims
- 0290US11821860B2Optical three-dimensional scanning for collision avoidance in microscopy systemCARL ZEISS X RAY MICROSCOPY INC·Filed 2020·Granted Nov 21, 2023·2 cites·20 claims
- 0377US6146907AMethod of forming a dielectric thin film having low loss composition of Bax Sry Ca1-x-y TiO3 : Ba0.12-0.25 Sr0.35-0.47 Ca0.32-0.53 TiO3US ENERGY·Filed 1999·Granted Nov 14, 2000·42 cites·16 claims
- 0447US6285049B1Low loss composition of BaxSryCa1-x-yTiO3: Ba0.12-0.25Sr0.35-0.47Ca0.32-0.53TiO3US ENERGY·Filed 2000·Granted Sep 4, 2001·1 cites·1 claims
- 0542US6660414B1Tungsten-doped thin film materialsUS DEPT ENERGY·Filed 1999·Granted Dec 9, 2003·9 cites·6 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →