Inventor · disambiguated record
Hao Chen
Also filed as: CHEN HAO · CHEN HAO-YU
117 granted patents·15 pending applications·975 citations·filing 2002–2025
99Inventor score
Files withTAIWAN SEMICONDUCTOR MFG CO LTD44TAIWAN SEMICONDUCTOR MFG23INNOLUX CORP10WANG MILL-JER8ROBGENIX MEDICAL PTE LTD5
Top patents by PatentIndex Score
132 records- 0198US6855606B2Semiconductor nano-rod devicesTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Feb 15, 2005·182 cites·12 claims
- 0297US9664707B2Testing holders for chip unit and die packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted May 30, 2017·9 cites·20 claims
- 0397US9453877B2Testing holders for chip unit and die packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Sep 27, 2016·9 cites·20 claims
- 0497US9341671B2Testing holders for chip unit and die packageTAIWAN SEMICONDUCTOR MFG·Filed 2013·Granted May 17, 2016·14 cites·20 claims
- 0597US7074656B2Doping of semiconductor fin devicesTAIWAN SEMICONDUCTOR MFG·Filed 2003·Granted Jul 11, 2006·128 cites·59 claims
- 0697US6720619B1Semiconductor-on-insulator chip incorporating partially-depleted, fully-depleted, and multiple-gate devicesTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Apr 13, 2004·172 cites·16 claims
- 0796US10067181B2Testing holders for chip unit and die packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Sep 4, 2018·5 cites·20 claims
- 0895US9086452B2Three-dimensional integrated circuit and method for wireless information access thereofWANG MILL-JER·Filed 2012·Granted Jul 21, 2015·26 cites·20 claims
- 0994US10698026B2Testing holders for chip unit and die packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted Jun 30, 2020·3 cites·20 claims
- 1094US7608515B2Diffusion layer for stressed semiconductor devicesTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Oct 27, 2009·28 cites·20 claims
- 1193US8957691B2Probe cards for probing integrated circuitsWANG MILL-JER·Filed 2011·Granted Feb 17, 2015·12 cites·22 claims
- 1292US11340291B2Testing holders for chip unit and die packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2020·Granted May 24, 2022·2 cites·20 claims
- 1391US8922230B23D IC testing apparatusWANG MILL-JER·Filed 2011·Granted Dec 30, 2014·10 cites·14 claims
- 1491US7635632B2Gate electrode for a semiconductor fin deviceTAIWAN SEMICONDUCTOR MFG·Filed 2007·Granted Dec 22, 2009·17 cites·10 claims
- 1591US7585711B2Semiconductor-on-insulator (SOI) strained active area transistorTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Sep 8, 2009·21 cites·42 claims
- 1690US11936278B2Fan braking structureASIA VITAL COMPONENTS CO LTD·Filed 2023·Granted Mar 19, 2024·1 cites·5 claims
- 1790US9372227B2Integrated circuit test system and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Jun 21, 2016·10 cites·17 claims
- 1890US8053839B2Doping of semiconductor fin devicesTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted Nov 8, 2011·8 cites·7 claims
- 1990US7948037B2Multiple-gate transistor structure and method for fabricatingTAIWAN SEMICONDUCTOR MFG·Filed 2010·Granted May 24, 2011·11 cites·18 claims
- 2089US10124111B2Small molecule dye for molecular imaging and photothermal therapyUNIV LELAND STANFORD JUNIOR·Filed 2016·Granted Nov 13, 2018·6 cites·31 claims
- 2189US8865539B2Fully depleted SOI multiple threshold voltage applicationCHEN HAO-YU·Filed 2011·Granted Oct 21, 2014·12 cites·20 claims
- 2289US8421073B2Test structures for through silicon vias (TSVs) of three dimensional integrated circuit (3DIC)LIN HUNG-CHIH·Filed 2011·Granted Apr 16, 2013·10 cites·20 claims
- 2389US7701008B2Doping of semiconductor fin devicesTAIWAN SEMICONDUCTOR MFG·Filed 2006·Granted Apr 20, 2010·11 cites·19 claims
- 2487US7423323B2Semiconductor device with raised segmentTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Sep 9, 2008·12 cites·20 claims
- 2587US7382023B2Fully depleted SOI multiple threshold voltage applicationTAIWAN SEMICONDUCTOR MFG·Filed 2005·Granted Jun 3, 2008·13 cites·31 claims
- 2686US12147099B2Electronic device comprising a viewing angle control structure having a phase adjustment structure between a second alignment layer and a second substrateINNOLUX CORP·Filed 2022·Granted Nov 19, 2024·1 cites·18 claims
- 2786USD973820SSwimming ringHANGZHOU JUHENG BRAND MAN CO LTD·Filed 2022·Granted Dec 27, 2022·13 cites·1 claims
- 2886US10073135B2Alignment testing for tiered semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2017·Granted Sep 11, 2018·2 cites·20 claims
- 2986US9900970B2Three dimensional integrated circuit electrostatic discharge protection and prevention test interfaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Feb 20, 2018·2 cites·19 claims
- 3086US9252593B2Three dimensional integrated circuit electrostatic discharge protection and prevention test interfaceTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2012·Granted Feb 2, 2016·4 cites·15 claims
- 3185USD1030701SHeadphoneDONGGUAN LIESHENG ELECTRONIC TECHNOLOGY CO LTD·Filed 2023·Granted Jun 11, 2024·13 cites·1 claims
- 3285US9754847B2Circuit probing structures and methods for probing the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted Sep 5, 2017·4 cites·20 claims
- 3385US9671457B23D IC testing apparatusTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2014·Granted Jun 6, 2017·5 cites·18 claims
- 3485US9658281B2Alignment testing for tiered semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted May 23, 2017·4 cites·20 claims
- 3585US7176092B2Gate electrode for a semiconductor fin deviceTAIWAN SEMICONDUCTOR MFG·Filed 2004·Granted Feb 13, 2007·30 cites·29 claims
- 3684US11933311B2Fan brake structureASIA VITAL COMPONENTS CO LTD·Filed 2023·Granted Mar 19, 2024·1 cites·10 claims
- 3784US9859176B1Semiconductor device, test system and method of the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2016·Granted Jan 2, 2018·4 cites·20 claims
- 3882US11906573B2Testing module and testing method using the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2023·Granted Feb 20, 2024·0 cites·20 claims
- 3982US11579190B2Testing holders for chip unit and die packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Feb 14, 2023·0 cites·20 claims
- 4082US10641819B2Alignment testing for tiered semiconductor structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2018·Granted May 5, 2020·1 cites·20 claims
- 4182US9568543B2Structure and method for testing stacked CMOS structureTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2013·Granted Feb 14, 2017·5 cites·18 claims
- 4282US2024133942A1Testing module and testing method using the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2024·Application pending·0 cites
- 4381US11604211B1Testing device and method for integrated circuit packageTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2021·Granted Mar 14, 2023·1 cites·20 claims
- 4481US7230270B2Self-aligned double gate device and method for forming sameTAIWAN SEMICONDUCTOR MANFACTUR·Filed 2004·Granted Jun 12, 2007·27 cites·28 claims
- 4580US11693045B2Testing module and testing method using the sameTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Jul 4, 2023·0 cites·20 claims
- 4680US8866488B2Power compensation in 3DIC testingWANG MILL-JER·Filed 2011·Granted Oct 21, 2014·4 cites·20 claims
- 4779US7728360B2Multiple-gate transistor structureTAIWAN SEMICONDUCTOR MFG·Filed 2002·Granted Jun 1, 2010·21 cites·19 claims
- 4878US11962225B2Fan braking structureASIA VITAL COMPONENTS CO LTD·Filed 2023·Granted Apr 16, 2024·0 cites·5 claims
- 4978US11852672B2Test circuit and methodTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2022·Granted Dec 26, 2023·0 cites·20 claims
- 5078US9653927B2Composite integrated circuits and methods for wireless interactions therewithTAIWAN SEMICONDUCTOR MFG CO LTD·Filed 2015·Granted May 16, 2017·2 cites·20 claims
Showing the top 50 of 132 patent records by PatentIndex Score.
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →