Inventor · disambiguated record
Hao-Yen Cheng
Also filed as: CHENG HAO-YEN
9 granted patents·5 pending applications·14 citations·filing 2022–2025
80Inventor score
Technology areasG01R
Files withCHUNGHWA PREC TEST TECH CO LTD14
Top patents by PatentIndex Score
14 records- 0193US11913973B2Cantilever probe card device and focusing probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Feb 27, 2024·4 cites·9 claims
- 0293US11879912B2Cantilever probe card and carrier thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Jan 23, 2024·4 cites·10 claims
- 0391US12467949B2Cantilever probe card device and light absorption probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Granted Nov 11, 2025·2 cites·10 claims
- 0490US12181496B2Cantilever probe card and probe module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Dec 31, 2024·2 cites·10 claims
- 0590US12092661B2Cantilever probe card device and elastic probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Sep 17, 2024·2 cites·10 claims
- 0658US11988686B2Vertical probe card and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted May 21, 2024·0 cites·10 claims
- 0758US2025283915A1Probe card device having expansion configuration and probe head thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 0858US2025283914A1Probe card device having heat-dissipation configuration and guide board module thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 0958US2025283912A1Probe card device having parallel connection configuration and guide board mechanism thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2025·Application pending·0 cites
- 1056US2024385217A1Cantilever probe card device and climb-restricting probeCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Application pending·0 cites
- 1156US2024385222A1Cantilever probe card device and cantilever probe moduleCHUNGHWA PREC TEST TECH CO LTD·Filed 2024·Application pending·0 cites
- 1255US12111336B2Modular vertical probe cardCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Oct 8, 2024·0 cites·9 claims
- 1353US12203961B2Vertical probe card device and fence-like probe thereofCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Jan 21, 2025·0 cites·8 claims
- 1453US12146897B2Vertical probe card having different probesCHUNGHWA PREC TEST TECH CO LTD·Filed 2022·Granted Nov 19, 2024·0 cites·9 claims
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Identity basis: PatentsView inventor disambiguation (2025Q4-odp release). How scoring works →